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Aqueous Technologies to Feature New Generation Zero-Ion Contamination Tester at APEX 2009

Mar 10, 2009

Rancho Cucamonga, CA - January 2009 � Aqueous Technologies Corp. announces that it will introduce the newly updated Zero-Ion Ionic Contamination (Cleanliness) Tester, which is designed to test electronics assemblies for ionic contamination, in booth 2247 at the upcoming IPC/APEX conference and exhibition, scheduled to take place March 31-April 2, 2009 in Las Vegas.

The Zero-Ion automatically removes and detects contamination on an electrical assembly or bare board and provides quantitative contamination measurements.

The Zero-Ion uses a dynamic technology that provides automatic regeneration of the machine's test solution, maintaining a high degree of test solution sensitivity. The Zero-Ion meets the requirements of military and commercial cleanliness testing standards including MIL 2000A, IPC test method 001, MIL-C-28809, MIL-P-55110 and IPC TM650-2.3.26.

The Zero-Ion has been reviewed by the U.S. Naval Air Weapons Center and determined to be the most sensitive ionic contamination tester available. The Zero-Ion also has been determined to be 3.7 times more sensitive than the manual resistivity of solvent extract (R.O.S.E.) test.

The Zero-Ion performs cleanliness tests automatically and is capable of storing 50 test parameters within its internal controller. When connected to a PC via optional PC interface software, the Zero-Ion is capable of storing virtually unlimited quantities of testing parameters.

The Zero-Ion is equipped with a built-in printer that records cleanliness testing results.

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