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Agilent Technologies' Experts Contribute Chapters to Digital Communications Test and Measurement Handbook

Mar 20, 2008

Several authors from Agilent's Digital Test Division have written chapters about High-Speed Physical Layer Characterization in the new Digital Communications Test and Measurement Handbook, co-edited by Dennis Derickson, California Polytechnic State University and Marcus Mueller, Agilent. The book covers basics, transmitter test, receiver test, and interconnect topics to verify system performance of high-speed digital links.

The following key chapters of the new Digital Communications Test and Measurement Handbook from Prentice-Hall were authored by industry experts employed by Agilent Technologies:

  • Jitter Basics; Bit Error Ratio Testing; BERT Scan Measurements: Marcus Mueller, R&D lead engineer

  • Characterizing High-Speed Digital Communications Signals and Systems with the Equivalent-Time Sampling Oscilloscope: Greg LeCheminant, measurement applications specialist

  • Clock Synthesis, Phase Locked Loops, and Clock Recovery: Jim Stimple, R&D department scientist

  • Jitter Tolerance Testing: Michael Fleischer-Reumann, strategic product planner

  • Frequency Domain Measurements: Doug Yates, application consultant

  • Passive Elements for Test Setups: Rainer Plitschka, application specialist

The Handbook is published by Prentice-Hall, ISBN 0-13-220910-1 and available wherever technical books are sold. For more information please visit http://www.informit.com/title/0132209101.

For any additional questions about Agilent's conntribution or other test instruments, contact Janet Smith at +1 970 679 5397 or janet_smith@agilent.com to set up a specific meeting time.

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