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News from Agilent Technologies, Inc.


Agilent Technologies' Experts Contribute Chapters to Digital Communications Test and Measurement Handbook

Mar 20, 2008

Several authors from Agilent's Digital Test Division have written chapters about High-Speed Physical Layer Characterization in the new Digital Communications Test and Measurement Handbook, co-edited by Dennis Derickson, California Polytechnic State University and Marcus Mueller, Agilent. The book covers basics, transmitter test, receiver test, and interconnect topics to verify system performance of high-speed digital links.

The following key chapters of the new Digital Communications Test and Measurement Handbook from Prentice-Hall were authored by industry experts employed by Agilent Technologies:

  • Jitter Basics; Bit Error Ratio Testing; BERT Scan Measurements: Marcus Mueller, R&D lead engineer

  • Characterizing High-Speed Digital Communications Signals and Systems with the Equivalent-Time Sampling Oscilloscope: Greg LeCheminant, measurement applications specialist

  • Clock Synthesis, Phase Locked Loops, and Clock Recovery: Jim Stimple, R&D department scientist

  • Jitter Tolerance Testing: Michael Fleischer-Reumann, strategic product planner

  • Frequency Domain Measurements: Doug Yates, application consultant

  • Passive Elements for Test Setups: Rainer Plitschka, application specialist

The Handbook is published by Prentice-Hall, ISBN 0-13-220910-1 and available wherever technical books are sold. For more information please visit http://www.informit.com/title/0132209101.

For any additional questions about Agilent's conntribution or other test instruments, contact Janet Smith at +1 970 679 5397 or janet_smith@agilent.com to set up a specific meeting time.

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