SMT, PCB Electronics Industry News
  • SMTnet
  • »
  • Industry News
  • »
  • Agilent Technologies' Experts Contribute Chapters to Digital Communications Test and Measurement Handbook

Agilent Technologies' Experts Contribute Chapters to Digital Communications Test and Measurement Handbook

Mar 20, 2008

Several authors from Agilent's Digital Test Division have written chapters about High-Speed Physical Layer Characterization in the new Digital Communications Test and Measurement Handbook, co-edited by Dennis Derickson, California Polytechnic State University and Marcus Mueller, Agilent. The book covers basics, transmitter test, receiver test, and interconnect topics to verify system performance of high-speed digital links.

The following key chapters of the new Digital Communications Test and Measurement Handbook from Prentice-Hall were authored by industry experts employed by Agilent Technologies:

  • Jitter Basics; Bit Error Ratio Testing; BERT Scan Measurements: Marcus Mueller, R&D lead engineer

  • Characterizing High-Speed Digital Communications Signals and Systems with the Equivalent-Time Sampling Oscilloscope: Greg LeCheminant, measurement applications specialist

  • Clock Synthesis, Phase Locked Loops, and Clock Recovery: Jim Stimple, R&D department scientist

  • Jitter Tolerance Testing: Michael Fleischer-Reumann, strategic product planner

  • Frequency Domain Measurements: Doug Yates, application consultant

  • Passive Elements for Test Setups: Rainer Plitschka, application specialist

The Handbook is published by Prentice-Hall, ISBN 0-13-220910-1 and available wherever technical books are sold. For more information please visit http://www.informit.com/title/0132209101.

For any additional questions about Agilent's conntribution or other test instruments, contact Janet Smith at +1 970 679 5397 or janet_smith@agilent.com to set up a specific meeting time.

Jan 08, 2014 -

Agilent Technologies Reveals Name of Electronic Measurement Spin-Off Company

Jun 29, 2010 -

Agilent gets serious about JTAG test

Jun 20, 2009 -

Agilent Technologies' Digital Measurement Forum Focuses on Trends Influencing Future of Industry

Feb 15, 2009 -

Agilent Technologies Presents the 2009 Aerospace Defense Symposium "Focus Where it Counts"

Jan 21, 2009 -

Agilent Technologies' New Solder Paste Inspection System Available Feb. 15

Dec 06, 2008 -

Agilent Technologies Displays Comprehensive Femtocell Testing Capability

Nov 19, 2008 -

Agilent Technologies, Solution Sources Programming Announce Additional In-Circuit Test Capacity at Solution Sources

Oct 01, 2008 -

Agilent Technologies to Present Advances in Limited Access Test Solutions at International Test Week

Sep 24, 2008 -

Agilent Technologies, Altron Inc. Announce Altron's Selection of Agilent Medalist sj5000 AOI System

Sep 08, 2008 -

Agilent Technologies' New 10 MHz Function/Arbitrary Waveform Generator Provides High-Quality Waveforms at Economical Price

85 more news from Agilent Technologies, Inc. »

Feb 21, 2018 -

Joseph Stockunas, Nordson Corporation Corporate VP, Appointed to SEMI Foundation Board of Trustees

Feb 21, 2018 -

VJ Electronix Hires Industry Expert to Continue Strengthening Global Sales and Services

Feb 21, 2018 -

Optimal Electronics signs sales agreement with ARK Manufacturing Solutions

Feb 21, 2018 -

ZESTRON to Demonstrate Leading Cleaning Technologies at IPC APEX 2018

Feb 21, 2018 -

Datest Partners with Southwest Systems to Represent Its PCBA Testing & Inspection Services

Feb 20, 2018 -

Microtronic GmbH Signs Distribution Agreement with Exmel Solutions Ltd.

Feb 20, 2018 -

Aegis Software Unveils the Industry’s Most Complete Quality Management System at APEX 2018

Feb 20, 2018 -

STI Announces Marietta Lemieux’s Selection as Presenter at “Electronics in Harsh Environments Conference”

Feb 20, 2018 -

BTU to Show the PYRAMAX 125N Dual Lane Reflow Oven at productronica China

Feb 20, 2018 -

Five Reasons to Visit Creative Electron at IPC APEX

See electronics manufacturing industry news »

Agilent Technologies' Experts Contribute Chapters to Digital Communications Test and Measurement Handbook news release has been viewed 805 times

  • SMTnet
  • »
  • Industry News
  • »
  • Agilent Technologies' Experts Contribute Chapters to Digital Communications Test and Measurement Handbook
track trace and control

Fully automatic selective soldering stations