SMT, PCB Electronics Industry News

SMT, PCB Electronics Industry News

News from ViTrox Technologies

Award-Winning AXI and 3D AOI from ViTrox Technologies – Find out Why at NEPCON Japan

Dec 22, 2015

ViTrox Technologies today announced that it will exhibit with KYORITSU TEST SYSTEM CO., LTD. in East 3 hall, No. E 16-28 at NEPCON Japan, scheduled to take place on Jan. 13-15, 2016 at the Tokyo Big Sight in Japan. ViTrox has been selected for more than 10 prestigious industry awards for its AXI and AOI developments over the last five years. Find out why and check out the award-winning V810 S2EXi In-line 3D Advanced AXI system and V510 Optimus 3D AOI system.

V810 S2EXi can handle boards up to 19 x 24", an increase of 10 percent over its predecessor – the V810 S2 system. It supports boards up to 280mils thick and 4.5kgs. With the introduction of the Motorized X-ray Tube and Motorized Filter Height Sensor (FHS), V810 S2EXi offers greater top clearance up to 50mm and bottom clearance up to 70mm. High accuracy and repeatability are achieved with this motorized closed-loop design.

V810 S2EXi supports Variable Magnification (VM), including 23um, 19um and 11um. This feature enables V810 S2EXi to inspect smaller pitch component joints, such as 01005s and micro BGAs with joints at 250 microns with 11 micron resolution. Magnification configuration becomes fast and simple by adjusting the motorized Z-axis and FHS.

The V510 Optimus 3D AOI uses 2D + 3D inspection concurrently to achieve high productivity and high detectability. It boasts capabilities that are unmatched by other existing solutions in the market. The system is able to detect various types of challenging defects, such as Lifted Lead, Coplanarity, Black color PCB / Multicolor PCB, Presence / Absence, small components like 01005 and many others. V510 Optimus 3D AOI is coupled with structured RGB lighting illumination with multiple color LEDs as concurrent lightings. The revolutionary multi-angle multi-color illumination capability allows multiple images to be acquired for each view.

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