SMT, PCB Electronics Industry News

JEDEC Publishes Breakthrough Standard for Wide I/O Mobile DRAM

Jan 13, 2012

JEDEC Solid State Technology Association, the global leader in the development of standards for the microelectronics industry, today announced the availability of a new standard for Wide I/O mobile DRAM: JESD229 Wide I/O Single Data Rate (SDR). Widely anticipated by the industry, Wide I/O mobile DRAM is a breakthrough technology that will meet industry demands for increased levels of integration as well as improved bandwidth, latency, power, weight and form factor; providing the ultimate in performance, energy efficiency and small size for smartphones, tablets, handheld gaming consoles and other mobile devices. JESD229 may be downloaded free of charge from the JEDEC website at jedec.org/standards-documents/results/jesd229.

Wide I/O mobile DRAM enables chip-level three dimensional (3D) stacking with Through Silicon Via (TSV) interconnects and memory chips directly stacked upon a System on a Chip (SoC). The standard defines features, functionalities, AC and DC characteristics, and ball/signal assignments. It is particularly well-suited for applications requiring extreme power efficiency and increased memory bandwidth (up to 17GBps). Examples include 3D Gaming, HD Video (1080p H264 video, pico projectors), and running multiple applications simultaneously. Wide I/O offers twice the bandwidth of the previous generation standard, LPDDR2, at the same rate of power consumption.

Sophie Dumas, Chairman of the JC-42.6 Subcommittee for Low Power Memories, said, “High performance mobile devices such as smartphones and tablets require high bandwidth and density, driven by demands for improved performance.” She added, “JEDEC’s JC-42.6 Subcommittee is pleased to provide a solution to this industry need with the publication of JESD229 for Wide I/O mobile DRAM, which will support the high resolution display, high quality graphics and multi-tasking capabilities required by device end users now and in the future.”


JEDEC is the leading developer of standards for the microelectronics industry.  Over 4,000 participants, appointed by nearly 300 companies, work together in 50 JEDEC committees to meet the needs of every segment of the industry, manufacturers and consumers alike. The publications and standards that they generate are accepted throughout the world. All JEDEC standards are available online, at no charge. For more information, visit www.jedec.org.

Jan 07, 2012 -

JEDEC Publishes Breakthrough Standard for Wide I/O Mobile DRAM

Aug 24, 2011 -

JEDEC Announces Key Attributes of Upcoming DDR4 Standard

Jun 22, 2011 -

JEDEC Announces Publication of Inspection Criteria for Microelectronic Packages and Covers (JESD9B)

Jun 16, 2011 -

JEDEC Announces Publication of e-MMC Standard Update v4.5

Mar 21, 2011 -

JEDEC Announces Broad Spectrum of 3D-IC Standards Development

Feb 24, 2011 -

JEDEC Announces Publication of Universal Flash Storage (UFS) Standard

Feb 10, 2011 -

JEDEC to Standardize Hybrid Memory Modules

Jun 27, 2017 -

Flying Probe, Functional Test & Inline Test – Visit Acculogic at SMTA Ohio Expo

Jun 27, 2017 -

VJ Technologies and Datest Partner in West Coast Inspection Services, Showroom and Demonstration Center.

Jun 26, 2017 -

Altus get SMART with Koh Young’s Innovative New Software

Jun 26, 2017 -

Ersa to Hold Versaflow 3 Level II Maintenance Training Course

Jun 25, 2017 -

Libra Industries’ Christopher R. Howell Memorial Foundation Awards $20,000 in Scholarships during Annual Golf Outing

Jun 25, 2017 -

SHENMAO Exhibits at IMAPS System in Package June 27-28, 2017 Introducing 3 New Semiconductor Packaging Fluxes

Jun 25, 2017 -

Ersa Brings the ‘Little Big One’ to SMTA Ohio – Award-Winning Selective Solder

Jun 25, 2017 -

Optimal Electronics Releases Process Control and Traceability Solution for Nordson ASYMTEK Applications in Clean Rooms for Sensor Assembly

Jun 25, 2017 -

Inovaxe Partners with Repstronics in Mexico

Jun 22, 2017 -

PNC Inc. Invests in LED Laser Direct Imaging system from Miva Technologies

See electronics manufacturing industry news »

JEDEC Publishes Breakthrough Standard for Wide I/O Mobile DRAM news release has been viewed 652 times

Fully automatic selective soldering stations

Jetting Pump for Integration