Sep 01, 2011 
KIC, the leader of thermal process development and control products, and winner of multiple industry awards, announces that its Product Manager MB (Marybeth) Allen will present on the topic of Non-Destructive Profiling Methods at the upcoming SMTA Long Island Expo and Technical Forum on September 21, 2011 at the Islandia Marriott Long Island in Islandia, NY. The discussion will begin at 3:15 p.m. in Salon C&D.
Some profiling methods are either non-repeatable or destructive. This presentation discusses alternatives that cover faster setup, repeatable results and eliminate the destruction of the profiling board. The solutions to be discussed are cost-effective and provide quality improvements.
MB Allen has worked in the electronics industry for more than 20 years and been associated with KIC for 22 years. Now KIC’s product manager, she was the company’s General Manager in Europe for the past six years and the North American Sales Manager before that.
Based in San Diego, KIC is the industry leader in automated thermal management tools and systems for reflow, wave, cure and semiconductor thermal processes. The company pioneered the development of oven profilers and process development tools, and then worked to create the next generation of thermal systems to help manufacturers optimize and monitor thermal processes.
In addition to KIC Explorer, products include the KIC 24/7 continuous monitoring system, the KIC Vision automatic profiling system and more. With the introduction of cutting edge tools, the company continues to stay on the leading edge of process optimization and real-time thermal management systems, and has won numerous industry awards.
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