The Capital Chapter is pleased to announce the second technical presentation for their Expo and Tech Forum which will be held at the Johns Hopkins University, in Laurel MD on September 13, 2011.
This year’s Technical Program includes four presentations given by industry experts and focusing on key topics. David Pinsky, Raytheon Integrated Defense Systems, will present “Practical tin whisker risk management for high-reliability systems”. The presentation will focus on practical aspects of managing tin whisker risks within the context of high reliability systems. A methodology for performing application-specific risk assessments will be presented that is based on a risk assessment algorithm. The critical topic of controlling purchased materials, components, and assemblies will be also addressed.
David is an Engineering Fellow with Raytheon Integrated Defense Systems with over 28 years of industry experience in failure analysis and materials selection for aerospace products. He chairs the Raytheon Tin Whisker Core Team as well as the Raytheon Global Substances Engineering Team. Mr. Pinsky developed the Raytheon policy and standard practices for tin whisker risk mitigation. He is a member of the Lead-Free Electronics Risk Management (PERM) working group and served as an invited lead-free SME on the DoD’s Lead-Free Manhattan Project (LFMP). David has published numerous papers in the area of whisker theory and risk management, and authored the chapter on reliability in a textbook on green electronics.
The Chapter has scheduled a total of 4 presentations throughout the day, and details will be announced in the following weeks. In addition to the presentations, attendees will have the opportunity to meet industry experts and partners and have the possibility to find answers to their process questions.
To register as an attendee or exhibitor, please follow the link for detailed registration information: http://www.smta.org/expos/#capital