Test Research (TRI) TR5001E

Model:	Test Research (TRI) TR5001E
Category:	In-Circuit Testers
Model Year:	2012
Condition:	used
Location:	Mexico
Offered by:	SMTUNION
	Contact SMTUNION

Fealures

• Modular upgrade options from MDA to ICT and functional test
• High fault coverage test solution
• Limited access solution and functional test expansion using PXI modules
• Friendly UI with fast and easy program development

Tester Specifications

Analog/hybrid test points: 3200 analog or maximum digital test points: 1600
Operating System: Microsoft® Windows compatible PC, Windows 7-10
Fixture Type: Offline press type fixture

Analog Test Hardware

6-wire measurement switching matrix
Programmable AC/DC/DC High voltage and current sources
AC/DC voltage, DC current measurement, frequency
Component R/L/C measurement

Analog Hardware

TestJet vectorless open circuit detection
Arbitrary Waveform Generator

Digital Testing

Non-multiplexing 1:1 per pin architecture with independent per-pin level setting
DUT power supplies: 5 V@3 A, 3.3 V@3 A, 12 V@3A, -12 V@1 A and 24 V@3 A
Programmable DUT power supplies: 75 V / 8 A max, 200W maximum output power
Includes BScan Chain Test, BScan Cluster Test, BScan Virtual Nails Test, BScan Virtual Chain Test and IEEE1149.6 Test
On-board Flash, EEPROM, MAC programming

Max PCB Size

Standard: 420 x 300 mm
Option: 500 x 350 mm or larger