Agilent 4156C
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Agilent 4156C |
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Location: |
Florida, USA |
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Agilent-Keysight 4156C
Precision Semiconductor Parameter Analyzer
Agilent 4156C Precision Semiconductor Parameter Analyzer Bench top solution for advanced device characterization. The superior low-current and low-voltage resolution and built-in quasi-static CV measurement capability of the 4156C provide a firm foundation for future expansion with other measurement instruments. The 41501B Expander extends your capabilities to 1A/200V, and add a low noise ground unit and dual pulse generators on the 4156C. Key Features & Specifications General features
Highly accurate laboratory bench top parameter analyzer for advanced device characterization
4x High-resolution SMU, 2xVSU and 2xVMU
Fill-in-the blanks front panel operation
Includes Desktop EasyEXPERT software for PC-based GUI instrument control
Measurement capabilities
1 femtoamp and 0.2 microvolt measurement resolution
QSCV, Stress Mode, Knob-sweep, Stand-by function
+/- 200 Volts and +/- 1 Amp High-Power SMU, Pulse Generator capabilities available by optional 41501B
Desktop EasyEXPERT Software
Same test and measurement environment for B1500A Semiconductor Device Analyzer
Intuitive, task-oriented approach to parametric test
Furnished with over 80 pre-defined, user-modifiable application tests
Automatically save data to hard disk drive or any networked drive
Offline data analysis and application test development via Desktop EasyEXPERT software
Option
5223-36 CABLE, TRIAXIAL MALE
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