Comparison of Testing Methods for Residues on Electronic Hardware
Published: |
December 26, 2023 |
Author: |
Terry Munson |
Abstract: |
In this white paper, we discuss the pros and cons of five analytical techniques when applied to residue analysis on electronic assemblies. We evaluate the following for their application and limitations for analyzing both visible and invisible residues: FITR, SEM/EDX, XRF, Ion Chromatography, and ROSE... |
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