Analyzing the Impact of X-ray Tomography on the Reliability of Integrated Circuits
Published: |
March 18, 2021 |
Author: |
Halit Dogan, Md Mahbub Alam, Navid Asadizanjani, Sina Shahbazmohamadi, Domenic Forte and Mark Tehranipoor |
Abstract: |
X-ray tomography is a promising technique that can provide micron level, internal structure, and three dimensional (3D) information of an integrated circuit (IC) component without the need for serial sectioning or decapsulation. This is especially useful for counterfeit IC detection as demonstrated by recent work. Although the components remain physically intact during tomography, the effect of radiation on the electrical functionality is not yet fully investigated. In this paper we analyze the impact of X-ray tomography on the reliability of ICs with different fabrication technologies.... |
|
|
|
|
|
|
You must be a Company Information:
More articles from University of Connecticut »
- Oct 12, 2021 - Advanced Physical Inspection Methods for Counterfeit IC Detection
- Feb 17, 2021 - Electrochemical Sensors For Nitrogen Species: A Review
- See all SMT / PCB technical articles from University of Connecticut »
More SMT / PCB assembly technical articles »
- Mar 19, 2024 - What is Underfill | GPD Global
- Mar 19, 2024 - Made in Japan: Solder Paste Jet Dispensing Machine | I.C.T ( Dongguan ICT Technology Co., Ltd. )
- Feb 26, 2024 - Precision Control in Electronic Assembly: Selective Wave Soldering Machine | I.C.T ( Dongguan ICT Technology Co., Ltd. )
- Feb 02, 2024 - Maximizing Efficiency: The High-Speed SMT Line With Laser Depanelizer | I.C.T ( Dongguan ICT Technology Co., Ltd. )
- Dec 27, 2023 - Revolutionizing Tech: SMT Auto IC Programming Machine Mastery | I.C.T ( Dongguan ICT Technology Co., Ltd. )
- Browse Technical Library »
Analyzing the Impact of X-ray Tomography on the Reliability of Integrated Circuits article has been viewed 557 times
