Application Of Build-in Self Test In Functional Test Of DSL

Published:	May 23, 2012
Author:	YaJun Gu, Ye Qin, ZhiJun Wang, David Wei, Andrew Ho, Stephen Chen, Zhen (Jane) Feng Ph. D., Murad Kurwa
Abstract:	first published in the 2012 IPC APEX EXPO technical conference proceedings. BIST (build-in self test ) is the technique of designing additional hardware and software features into integrated circuits to allow them to perform self-testing, i.e., testing of...

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