Technical Articles From ZN Technologies

Read technical articles about electronics manufacturing added by ZN Technologies

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Articles from ZN Technologies

1 technical article added by ZN Technologies

Company Information:

ZN Technologies (www.zntechnologies.com) specializes in assisting microelectronics companies achieve manufacturing efficiencies and yield/reliability improvement with our unique set of R&D/Failure Analysis capital equipment.

Marietta, Georgia, USA

Consultant / Service Provider

(404) 394-1455

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(2) products in the catalog

(1) technical library article

Projection Moiré vs. Shadow Moiré for Warpage Measurement and Failure Analysis of Advanced Packages

Jan 31, 2013 | Joe Thomas

There are three key industry trends that are driving the need for temperature-dependent warpage measurement: the trend toward finer-pitch devices, the emergence of lead-free processing, and changes in device form factors. Warpage measurement has become a key measurement for analysis; prevention and prediction of interconnect defects and has been employed in failure analysis labs and production sites worldwide. First published in the 2012 IPC APEX EXPO technical conference proceedings...