Technical Articles From Corelis Inc

Using JTAG Emulation for Board-Level Functional Test Demanding Test

Sep 02, 2010 | ScanExpress JET™ White Paper

As chip packaging and interconnectivity have become more dense and operate at higher clock frequencies, physical access for traditional bed-of-nails testing becomes limited. This results in loss of ICT (in-circuit test) fault coverage and higher test fi...