NF120 AW AXI(Auto X-ray Inspection) System
Company Information:
Name: |
NF120 AW AXI(Auto X-ray Inspection) System |
Category: |
|
Offered by: |
|
NF120 AW AXI(Auto X-ray Inspection) System Description:
Wafer-level Product In-line(Ireland) 2D, 3D CT AXI Machine
Automatic inspection equipment exclusively for the Wafer-level products and ultra-fine defects of mm can be detected using the Nano Tube of Class Focal spot 200nm. 2D,
as well as 70º Tilt's oblique CT method, accurately detects defects in overlapping areas that are difficult to read with 2D and 2.5D images in 3D images.
In addition, the X-ray Image Free Technique of the check can be applied to minimize the damage received by semiconductors.
- Auto Inspection X-ray Machine for Wafer-level Product
- detection microscopic defects of several μm using Nano Tube(Focal Spot 200nm)
- Minimize the damage of product by X-ray Damage-Free Technique
| X-ray Tube | 120kV / 200µA |
| X-ray Detector | 3.2MPixel FPD, 30fps |
| Min. Resolution | 200nm |
| Inspection Item | Micro Bump – Missing, Short, Bridge, Open, Void, Non-wet, Etc. TSV – Alignment, Void, Void, Non-wet, Etc. BGA, Bump, Solder Ball, Via hole |
| CT Scan Type | Oblique CT |
| Application | Wafer-level |
NF120 AW AXI(Auto X-ray Inspection) System was added in Aug 2020
NF120 AW AXI(Auto X-ray Inspection) System has been viewed 256 times
11 More Products from SEC :
