SMT Equipment

TestStation Fastest In-Circuit Test Platform

Company Information:

Teradyne is a leading supplier of Automatic Test Equipment used to test semiconductors, wireless products, data storage and complex electronic systems which serve consumer, communications, industrial and government customers.

North Reading, Massachusetts, USA

Consultant / Service Provider, Manufacturer

  • Phone +1/ 978 370-2700

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Company Postings:

(8) products in the catalog

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TestStation Fastest In-Circuit Test Platform

TestStation Fastest In-Circuit Test Platform

Name:

TestStation Fastest In-Circuit Test Platform

Category:

Test Equipment

Offered by:

Teradyne

   

TestStation Fastest In-Circuit Test Platform Description:

Reliable high-quality, high-volume testing for the latest printed circuit board assembly (PCBA) technologies.

TestStation in-circuit test systems provide full structural and functional coverage for a wide range of manufacturing, component, process, and performance defects for high-performance analog, digital, and mixed-signal devices used on modern PCBs.

Applications:

  • High-Reliability Products - Automotive and Industrial applications that require extreme fault detection capability, and parts-per-billion defect rates for the end-consumer
  • High-Complexity Products - Network, Computing, and Communications applications tests that incorporate large numbers of devices and require capability beyond 5,000 test points
  • High-Volume Products - Consumer and Wireless applications that require extremely low cost of test and no-touch manufacturing solutions

Standard features:

  • High performance Windows-based PC Controller
  • Optimized defect detection algorithms
  • High precision measurements of analog components
  • High-voltage source and measurement instruments capabilities
  • Arbitrary Waveform Generator Instrument
  • Sampling scope to capture on-board signals
  • Vectorless Test Technologies for detection of open pins on ICs and Connectors
  • Eight measurement channels scannable to any tester pin
  • GPIB bus for connection of IEEE-488 compatible instruments
  • Synchronized Analog & Digital subsystems
  • Built-in calibration standards module and self-test circuits
  • Dedicated, user programmable, relay drivers
  • High-level programming language
  • Powerful and easy-to-use Debug and Production user interface
  • FLASH and ISP Toolset for Programmable Logic Devices
  • Insightful Data Collection and Data Display software

Model Configuration:

Multiple Test Heads (2x, 3x, 4x throughput improvement)

  • TestStation Multi-Site
  • TestStation Duo

Inline & Automation Ready

  • TestStation Multi-Site Inline
  • TestStation Rackmount (TSR)

Compact Footprint

  • TestStation LH
  • TestStation Multi-Site Offline

High Pin Count (up to 15,360 pins)

  • TestStation LX
  • TestStation LX2

Compatible with Legacy/Discontinued Systems

  • TestStation
  • TestStation LH w/ ZTS Adapter
  • TestStation Duo
  • TestStation LX

Optional features:

  • Design-to-Build (D2B) CAD preparation software
  • TestStation Development Pro software
  • Up to 14-user programmable power supplies
  • System Frequency/Time Measurement (SFTM)
  • Framescan FX Vectorless Test capacitive opens test software
  • High-performance UltraPin II Digital Driver and Sensors
  • Specialized digital timing controls
  • High speed Clock Drive, Clock Sense, and Trigger (CST) signal pins
  • BasicSCAN boundary scan test model generation software
  • Scan Pathfinder limited-access boundary scan test generation and diagnostic software
  • Powered Framescan limited-access test solution
  • Deep Serial Memory instrument extends memory behind pin to 1GB
  • Multi-Function Application Board supports adding application-specific test hardware
  • PXI Functional Expansion Board expands the functional test capabilities of the tester
  • Dynamic Programming Extension supports DLL communication with factory software

TestStation Fastest In-Circuit Test Platform was added in May 2012

TestStation Fastest In-Circuit Test Platform has been viewed 912 times

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