Surface Mount Technology Industry Directory
Surface Mount Technology companies

World's premier measurement company, providing the critical tools and technologies that sense, measure, and interpret the physical and biological world.
category: Manufacturer of Assembly Equipment
When measurement matters, engineers, scientists, manufacturers, businesses, researchers, and government agencies rely on Agilent tools and solutions. From home entertainment to homeland security, from food safety to network reliability, and from communicating wirelessly to discovering the genetic basis of disease, Agilent provides the measurement capabilities that make our world more productive and a safer, healthier, more enjoyable place to live.
Agilent is committed to providing innovative measurement solutions that enable our customers and partners - the leaders in their fields - to deliver the products and services that make a measurable difference in the lives of people everywhere. With a singular focus on measurement, Agilent helps:
Electronic Measurement
Agilent's electronic measurement business provides standard and customized electronic measurement instruments and systems, monitoring, management and optimization tools for communications networks and services, software design tools and related services that are used in the design, development, manufacture, installation, deployment and operation of electronics equipment and communications networks and services.
Agilent Technologies has offerings for paste, pre and post reflow automated optical inspection with ...
Agilent Technologies has been a leader in 3D automated x-ray inspection for more than a decade with ...
Agilent's Technologies continues to innovate in in-circuit test with beadprobe technology, IVTEP, et...
category: Inspection
Automated 3D paste inspection for print process characterization, control and early defect preven...
Agilent Technologies has been a leader in 3D automated x-ray inspection for more than a decade with ...
Boundary Scan Advanced Diagnostic Methods
Published: |
Feb 14, 2013 |
Author: |
Christopher Cain |
Abstract: |
Boundary-scan (1149.1) technology was originally developed to provide a far easier method to perform digital DC testing to detect intra-IC interconnect assembly faults, such as solder shorts and opens. Today's advanced IC technology now includes high-speed differential interfaces that include AC or DC coupling components loaded on the printed circuit assembly. Simple stuck-at-high/low test methods are not sufficient to detect all assembly fault conditions, which includes shorts, opens and missing components. Improved diagnostics requires detailed circuit analysis, predictive assembly fault simulation and more complex testing to isolate and accurately detect all possible assembly faults... First published in the 2012 IPC APEX EXPO technical conference proceedings... |
The Morphology Evolution and Voiding of Solder Joints on QFN Central Pads with a Ni/Au Finish
Published: |
Oct 18, 2012 |
Author: |
Julie Silk, Jianbiao Pan, Mike Powers |
Abstract: |
First published in the 2012 IPC APEX EXPO technical conference proceedings. In this paper, we report on a comprehensive study regarding the morphology evolution and voiding of SnAgCu solder joints on the central pad of two different packages – QFN and an Agilent package called TOPS – on PCBs with a Ni/Au surface finish.... |
Evaluation of Laminates in Pb-free HASL Process and Pb-free Assembly Environment
Published: |
Sep 20, 2012 |
Author: |
Khaw Mei Ming, Andrey Lee |
Abstract: |
First published in the 2012 IPC APEX EXPO technical conference proceedings. An evaluation of four FR4 laminates in commonly used stack-ups was done to determine their survivability for the Pb-free HASL process followed by a worst case Pb-free manufacturin... |
1 more technical article(s) from Agilent Technologies, Inc. »
Agilent gets serious about JTAG test
Jun 29, 2010 | Agilent Technologies’ interest in boundary scan test support grows with its second JTAG test systems move in a month.
Agilent Technologies' Digital Measurement Forum Focuses on Trends Influencing Future of Industry
Jun 20, 2009 | Agilent Technologies Inc. (NYSE: A) today kicked off its Agilent Digital Measurement Forum (ADMF) in Seoul, Korea. The annual forum, which brings together local and global industry leaders to address all digital-related measurement solutions from consumer electronics to high-speed digital design, will be held in six countries in the Asia-Pacific region from June 18 to July 16. Partners and collaborators such as Xilinx, The MathWorks and Microchip Technology are participating in the forum.
Agilent Technologies Presents the 2009 Aerospace Defense Symposium "Focus Where it Counts"
Feb 15, 2009 | Agilent's Aerospace and Defense Symposium begins a two-month U.S. tour on February 23, 2009. The symposium provides presentations and demonstrations on how to combine design tools with cutting edge test solutions to help you build greater assurance in system readiness so you can focus on today's challenging missions.
Agilent Technologies' New Solder Paste Inspection System Available Feb. 15
Jan 21, 2009 | The Medalist SP50 Series 3 Dual Laser SPI System Offers Defect Coverage Down to 01005 Level
Agilent Technologies Displays Comprehensive Femtocell Testing Capability
Dec 06, 2008 | Agilent Technologies Inc. (NYSE: A) today announced it is demonstrating its comprehensive femtocell design and test capabilities here at the Femtocells USA event, Dec. 1-3. Included in its offering is the first 3GPP LTE femtocell test system used to test reference design.
Nov 19, 2008 | SANTA CLARA, Calif., and SAN JOSE, Calif., Nov. 18, 2008
Agilent Technologies to Present Advances in Limited Access Test Solutions at International Test Week
Oct 01, 2008 | Agilent's R&D scientists for In-Circuit Test solutions will be presenting at various sessions throughout the conference.
Agilent Technologies, Altron Inc. Announce Altron's Selection of Agilent Medalist sj5000 AOI System
Sep 24, 2008 | sj5000 Selected
Sep 08, 2008 | Agilent Technologies Inc. (NYSE: A) today introduced a new member of the function/arbitrary waveform family that delivers high-quality waveforms at an economical price. For design development and test engineers who need lower-frequency signals without sacrificing accuracy, this new instrument easily generates the waveforms needed for bench and system applications.
Sep 08, 2008 | Agilent Technologies Inc. (NYSE: A) today released a display tester designed for easy, customizable setup for visual testing of up to five major display formats. It is suitable for testing FPD and CRT displays as well as LCD panels in PC and TV manufacturing.
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