The SCANFLEX® Board Grabber is a universal tool to hold JTAG/Boundary Scan UUTs and modules. Oscilloscopes, logic analyzers or other instruments can be connected via additional nails probes. The Board Grabber can be used for rapid prototype testing i
New Equipment | Test Equipment
Incorporating over 22 world-wide patents in its design and construction, Acculogic's Flying Scorpion has evolved through cutting-edge research and development since 1998, to become the leading flying probe tester in the market. Key Features Pa
New Equipment | Test Equipment
Mixed Signal Flying Probe test system The Sprint 4510 family of flying probers are well known for their speed, reliability, ease of use and large world-wide installed base. Flying probe testers have few restrictions on access, require no test fixtu
New Equipment | Test Equipment
Using a sample boundary-scan IC, the JTAG Technologies BSDL generation/verification system automatically verifies the existing BSDL (Boundary-Scan Description Language) file or creates a BSDL file for the device if none exists, all in accordance with
Develop complete applications with ease The JTAG ProVision software suite is used to generate boundary-scan tests and in-system programming applications for assembled PCBs and systems. This professional development tool is fully automated and suppo
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The SCANBOOSTER™ product family complements the existing spectrum of SCANFLEX® solutions by an independent product range in the lower to mid-range performance area. Available family members are SCANBOOSTER/USB, SCANBOOSTER/USB-FXT, SCANBOOSTER/PCI-DT
Training Courses | | | PCB Design Courses
The PCB design courses teach students the process, techniques and tools needed to design layout of printed circuit boards.
Technical Library | 2013-02-14 12:54:29.0
Boundary-scan (1149.1) technology was originally developed to provide a far easier method to perform digital DC testing to detect intra-IC interconnect assembly faults, such as solder shorts and opens. Today's advanced IC technology now includes high-speed differential interfaces that include AC or DC coupling components loaded on the printed circuit assembly. Simple stuck-at-high/low test methods are not sufficient to detect all assembly fault conditions, which includes shorts, opens and missing components. Improved diagnostics requires detailed circuit analysis, predictive assembly fault simulation and more complex testing to isolate and accurately detect all possible assembly faults... First published in the 2012 IPC APEX EXPO technical conference proceedings
Technical Library | 2007-08-23 14:30:03.0
The complexity and programmability of modern embedded boards means that knowledge built up during debugging and testing must be regarded as Intellectual Property (IP) and therefore preserved. But many of the processes and tools used today do not provide a means to preserve or pass on this IP, and thereby forego valuable opportunities to save time and improve quality during subsequent stages of product development.
