Novel Probing Concepts for Mass-Production Tests: Design and Challenges SMTnet Express June 15, 2012, Subscribers: 25268, Members: Companies: 8896, Users: 33235 Novel Probing Concepts for Mass-Production Tests: Design and Challenges First
Drop Impact Reliability of Edge-bonded Lead-free Chipscale Packages Drop Impact Reliability of Edge-bonded Lead-free Chipscale Packages This paper presents the drop test reliability results for edge-bonded 0.5mm pitch lead-free chip scale
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SMTnet Express, March 19, 2020, Subscribers: 34,979, Companies: 10,981, Users: 25,700 Robust Reliability Testing For Drop-on-Demand Jet Printing Credits: Mycronic Technologies AB In this study, the question was how to perform statistically
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