Electronics Forum | Fri Jul 27 12:21:18 EDT 2012 | tpatrickwalsh
I am posting this here because I think it may have something to do with PCBA: I have a simple battery-powered consumer product (LED light) that we have been manufacturing for some time. All of a sudden in one batch, we have about a 4% rate of a sing
Electronics Forum | Thu May 22 12:08:36 EDT 2003 | Kris
What solder are you using ? what is the peak temeprature ? Are you using the right tools to place these components ?
Electronics Forum | Thu May 22 12:12:23 EDT 2003 | davef
Henry are you thinking ball peen hammer? Initial questions are: * If there information there, is there a way to get the Chinese character set translated? * When did these failures occure?
Electronics Forum | Thu May 22 08:46:05 EDT 2003 | Henry Lee
Hi I uploaded the photos http://hk.photos.yahoo.com/ee02lyk of the failure samples. The chip-cut and pin-hole were found after the manufacturing process. I initially suspect the crack happened during the reflow process.However, our factory analysis d
Electronics Forum | Mon Oct 02 19:04:53 EDT 2006 | DC
We had a issue on the SBGA and found stress built up at the corner of the SBGA after cool down to room temperature. It is confirmed by the warpage analysis. I expected that the stress caused by the heat spreader and the epoxy to the copper frame. O
Electronics Forum | Fri Jan 16 15:31:26 EST 2004 | davef
Bill This drives solder suppliers nuts, because it's not analytic: Dross inclusion testing can be conducted on the base solder in the solder pot and the virgin solder. Conduct this test by heating a sample of solder, contained in a clear beaker,
Electronics Forum | Thu Jan 15 21:16:18 EST 2009 | davef
Our first impulse would be to blame someone else. We'd send some of the DPAK from inventory to: * Supplier * Outside failure analysis laboratory ... for delidding and analysis
Electronics Forum | Wed Sep 30 14:17:06 EDT 2009 | davef
What does failure analysis of the BGA indicate? Is this: * ESD damage * Open circuits * Shorting What's the problem?
Electronics Forum | Thu Jan 15 15:16:56 EST 2009 | jsherrow
We recently had our customer report a component failure trend of a few percent. Analysis indicates wire bond failure internal to a d-pak caused by what appears to be chlorine contamination. We're running a lead free process with aqueous wash. 700 co
Electronics Forum | Thu Oct 01 07:03:55 EDT 2009 | davef
We doubt that Humiseal 1A33 is causing opens in your assemblies. We'd guess the opens occur earlier in the process, but are not hard failures. So, you pass your tests. When applied, the conformal coat flows into the gap in the ball crack and insulate
