Industry News | 2017-05-22 12:04:12.0
JTAG Technologies are excited to showcase their new collaborative product with Altium – JTAG Maps plus the latest Fixture Product, plus presentations by MD Peter van den Eijnden.
Industry News | 2009-02-06 15:35:58.0
Input will help the electronics industry improve test implementation and coverage
Industry News | 2007-06-22 11:43:27.0
Richardson, TX (June 19, 2007) � A new edition of the popular Boundary-Scan Tutorial from ASSET InterTech Inc., (www.asset-intertech.com) an international leader in boundary-scan (JTAG/IEEE 1149.1) test and in-system programming (ISP), includes expanded explanations of how to use JTAG as well as totally new sections describing complementary technologies such as the new IEEE 1149.6 Boundary-Scan Standard for Advanced Digital Networks and the IEEE 1532 In-System Configuration Standard.
Industry News | 2011-11-20 12:21:31.0
Datest has been awarded a Global Technology Award in the category of Test Services for its SPEA 4060 Flying Probe Tester with GOEPEL Boundary Scan.
Industry News | 2014-08-07 18:17:56.0
Acculogic Inc. announces that it will exhibit in Booth #817 at IEEE AUTOTEST 2014, scheduled to take place Sept. 15-18, 2014 in St. Louis, MO.
Industry News | 2010-06-29 11:33:33.0
Agilent Technologies’ interest in boundary scan test support grows with its second JTAG test systems move in a month.
Industry News | 2012-03-07 01:09:11.0
Datest has been awarded a 2012 NPI Award in the category of Test and Inspection - ICT for its SPEA 4060 Flying Probe Tester with GOEPEL Boundary Scan.
Industry News | 2016-04-12 08:55:31.0
Boundary Scan Market Leader, JTAG Technologies invites clients to join them at the Space Test Pasadena to discuss two hot avionic test topics.
Industry News | 2016-08-17 20:42:27.0
Acculogic Inc.announces that it will exhibit in Booth #1110 at IEEE AUTOTESTCON, scheduled to take place Sept. 12-15, 2016 in Anaheim, Ca. Company representatives will highlight Acculogic’s powerful suite of PC-based hardware and software tools specially designed for testing of electronic devices, boards and systems using the IEEE1149.1 and IEEE1149.6 standards.
Industry News | 2011-03-09 20:27:49.0
GOEPEL electronic, world-class vendor of JTAG/Boundary Scan solutions announces the availability of a new option in its recently introduced EDA software TAPChecker™. Multi-Chip Modules (MCM) and 3D chips are now supported, allowing testbench generation for VHDL, Verilog and STIL output formats.
