Electronics Forum | Wed Sep 30 18:43:46 EDT 1998 | Graham Naisbitt
Chrys, Please, refer firsatly to J-STD-001 Appendix D. Now, consider: SIR testing will help define the reliability of your finished assembly - it will not tell you how clean it is. Which do you or your customer prefer? Present SIR testing de
Electronics Forum | Tue Apr 03 20:46:32 EDT 2007 | Mike Konrad
We manufacture similar equipment. I would recommend that most of the testing be performed in an automatic shut-off mode. There are potential issues with both methods, automatic shut-off and fixed time tests. In an automatic shut-off mode, the cl
Electronics Forum | Fri Jun 01 10:52:37 EDT 2012 | blnorman
Neither the Omega meter nor the IC are officially "destructive" tests, but everywhere I worked we treated them that way. The boards were scrapped after the test. The Omega meter can be tested at elevated temps, but the IC sample is extracted at ele
Electronics Forum | Wed Dec 30 17:34:23 EST 1998 | Michael Allen
I'm afraid we don't agree regarding the best test method to use here. My understanding is as follows. The omegameter test measures board-level, ionic contamination (i.e., average for the entire board area and all components); it does not tell you w
Electronics Forum | Sat Feb 14 19:35:51 EST 1998 | C. Lao
Mr Lao We have some specialist knowledge on this subject and offer both equipment and services for these tests. My first recommendation is that take coupons manufactured by your PC Fabricator and then samples at each manufacturing stage: Bare coupon
Electronics Forum | Mon Jul 26 14:14:51 EDT 1999 | Steve Gregory
| | | We are having a process related problem with pullup resistors on a controller card which has a I960 micro-processor. | | | The controller monitors signal inputs and it's own resources then blinks a LED to indicate its working. The problem is th
Electronics Forum | Wed Nov 17 11:20:23 EST 1999 | Dave F
Hey Gyver: If you don�t mind (which you don�t have any choice about, because I�m going to do it anyhow, cause it�s MY word processor), I�m going to respond genericly, but still be directed to your question. Much of the following is paraphrased from
Electronics Forum | Mon Jul 26 10:25:12 EDT 1999 | Boca
| | We are having a process related problem with pullup resistors on a controller card which has a I960 micro-processor. | | The controller monitors signal inputs and it's own resources then blinks a LED to indicate its working. The problem is that a
Electronics Forum | Thu Mar 02 23:21:59 EST 2006 | KEN
I recently finished analysis of no-clean fluxes and Ionic contamination and cleaning processes. The results were eye opening. Summary: If you clean a no-clean you better do a good job. Many no-cleans produce a "waxy binder" to encapsulate the tro
Electronics Forum | Thu May 15 19:36:56 EDT 2008 | davef
Q1: static or dynamic? A1: search the fine SMTnet Archives. For instance, http://www.smtnet.com/forums/Index.cfm?CFApp=1&Message_ID=44837 Q2: localized testing (C3) or bulk testing (Omegameter/Zero Ion)? A2: depends on the contamination that you're
