Industry News | 2017-01-30 19:56:21.0
KYZEN is pleased to announce that Dr. Mike Bixenman will present two papers at the upcoming IPC APEX EXPO at the San Diego Convention Center. “Electrochemical Methods to Measure the Corrosion Potential of Flux Residues” will be presented during Session S04 on Tuesday, Feb. 14, 2017 from 1:30-3 p.m. The paper was co-authored by David Lober and Anna Ailworth, KYZEN, and Bruno Tolla, Ph.D., Jennifer Allen, Denis Jean and Kyle Loomis from Kester Corporation. The paper entitled, “Does Cleaning the PCB before Conformal Coating Add Value?” will be presented during Session S20 on Wednesday, Feb. 15, 2017 from 1:30-3 p.m. The paper was co-authored by Mark McMeen and Jason Tynes, STI Electronics, and Gustavo Arredondo, ParaTech Coating.
Technical Library | 2017-07-27 16:51:57.0
Reliability Expectations of Highly Dense Electronic Assemblies is commonly validated using Ion Chromatography and Surface Insulation Resistance. Surface Insulation Resistance tests resistance drops on both cleaned and non-cleaned circuit assemblies. It is well documented in the literature that SIR detects ionic residue and the potential of this residue to cause leakage currents in the presence of humidity and bias. Residues under leadless components are hard to inspect for and to ensure flux residue is totally removed. The question many assemblers consider is the risk of residues that may still be present under the body of components.
SMTnet Express, July 27, 2017, Subscribers: 30,636, Companies: 10,649, Users: 23,563 Electrochemical Methods to Measure the Corrosion Potential of Flux Residues Mike Bixenman, DBA, David Lober, Anna Ailworth - KYZEN Corporation , Bruno Tolla, Ph
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