Electronics Forum: osp thickness method of measurement (7)

Types of OSP Coating

Electronics Forum | Sat Sep 08 08:55:24 EDT 2007 | davef

We expect to see a copper shadow along the edge of pads when soldering boards with organic solderability protection [OSP]. IPC-A-610 has defined this as acceptable for years. During early reflow stages, the flux in paste dissolves the OSP where ther

Epoxy on bottom of SMT component

Electronics Forum | Tue Nov 27 20:05:31 EST 2007 | shy

Dback, Current method is by using dispenser machine to dispense the glue at PCB. This non-wetting is randomly and not repeating to the same location. My adhesive height is 0.01" to 0.035". Is this will cause the component to had a gap between the t

Industry News: osp thickness method of measurement (3)

The ‘Relativity’ of High Q Capacitors

Industry News | 2018-09-06 15:18:14.0

Although many High Q capacitors are available on the market, performance can vary widely depending on design and quality of manufacturing

Johanson technology

Kyzen's Dr. Mike Bixenman to Discuss Compatibility of Cleaning Agents at SMTAI 2011

Industry News | 2011-09-23 22:31:43.0

Kyzen announces that Dr. Mike Bixenman will present “Compatibility of Cleaning Agents with Nano-Coated Stencils” at the upcoming SMTA International Conference & Exhibition

KYZEN Corporation

Technical Library: osp thickness method of measurement (1)

Effects of Package Warpage on Head-in-Pillow Defect

Technical Library | 2017-07-06 15:50:17.0

Head-in-pillow (HiP) is a BGA defect which happens when solder balls and paste can't contact well during reflow soldering. Package warpage was one of the major reasons for HiP formation. In this paper, package warpage was measured and simulated. It was found that the package warpage was sensitive to the thickness of inside chips. A FEM method considering viscoelastic property of mold compound was introduced to simulate package warpage. The CTE mismatch was found contributes to more than 90% of the package warpage value when reflowing at the peak temperature. A method was introduced to measure the warpage threshold, which is the smallest warpage value that may lead to HiP. The results in different atmospheres showed that the warpage threshold was 50μm larger in N2 than that in air, suggesting that under N2 atmosphere the process window for HiP defects was larger than that under air, which agreed with the experiments.

Samsung Electronics

Express Newsletter: osp thickness method of measurement (591)

Partner Websites: osp thickness method of measurement (35)

Solder Dictionary of Terms | Nordson EFD

ASYMTEK Products | Nordson Electronics Solutions | https://www.nordson.com/en/divisions/efd/resources/solder-dictionary-of-terms

.   Brazing A method of joining metals that involves the use of a filler metal or alloy that melts over 450° C (842° F) and below the melting temperature of substrate materials

ASYMTEK Products | Nordson Electronics Solutions

The Last Will And Testament of the BGA Void

Heller Industries Inc. | https://hellerindustries.com/wp-content/uploads/2018/07/last-will-of-bga-void.pdf

software also provides a measurement of the ball diameter by indicating the diameter of the longest axis of the defined ball area. This is achieved by automatically counting the number of pixels in the long axis. This measurement is calibrated against the

Heller Industries Inc.


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