Technical Library: leveled (Page 3 of 16)

Optimizing Stencil Design For Lead-Free Smt Processing

Technical Library | 2023-06-12 19:18:24.0

As any new technology emerges, increasing levels of refinement are required to facilitate the mainstream implementation and continual improvement processes. In the case of lead-free processing, the initial hurdles of alloy and chemistry selection are cleared on the first level, providing a base process. The understanding gained from early work on the base process leads to the next level of refinement in optimizing the primary factors that influence yield. These factors may include thermal profiles, PWB surface finishes, component metallization, solder mask selection or stencil design.

Cookson Electronics Assembly Materials

Effect Of Silver In Common Lead-Free Alloys

Technical Library | 2021-09-08 14:03:55.0

There is need in the industry to understand the effects of silver presence in solders from various applications perspective. This article will attempt to present a review of the key published results on the silver containing alloys along with results of our internal studies on wave soldering, surface mount and BGA/CSP applications. Advantages and disadvantages of silver at different levels will be discussed. Specifically this report will focus on the effect of silver on process conditions, drop shock resistance, solder joint survivability in high strain rate situations, thermal fatigue resistance, Cu dissolution and effects of silver in combination with other alloy additives. Specific application problems demanding high silver level and other requiring silver level to the minimum will be discussed.

Cookson Electronics

Pushing the barriers of wafer level device integration: High-speed assembly, the case for MicroTape.

Technical Library | 2009-01-21 23:01:49.0

Over the last 10 years, the adoption of wafer-level packaging (WLP) has expanded to a wide range of semiconductor devices applied in a crosssection of industries from Automotive to Mobile Phone, Sensors to Medical Technology.

Siemens Process Industries and Drives

Reliability Testing For Microvias In Printed Wire Boards

Technical Library | 2021-01-21 02:04:27.0

Traditional single level microvia structures are generally considered the most robust type of interconnection within a printed wire board (PWB) substrate. The rapid implementation of HDI technology now commonly requires between 2, 3 or 4 levels of microvias sequentially processed into the product. Recent OEM funded reliability testing has confirmed that by increasing the levels (stack height) these structures are proving less reliable, when compared to their single or double level counterparts. Recently false positive results have been recorded on products tested with traditional thermal shock testing methodology (cycling between -40°C and 125°C, or 145°C). A number of companies are incurring product failures resulting in increased costs associated with replacing the circuit boards, components and added labour.

PWB Interconnect Solutions Inc.

Specifying Current for the Real World

Technical Library | 1999-05-06 15:14:48.0

To help the designer set the appropriate current level, AMP has developed a new method of specifying current-carrying capacity. This new method takes into account the various application factors that influence current rating.

TE Connectivity

The Performance of the Intel TFLOPS Supercomputer

Technical Library | 1999-05-07 09:56:38.0

The purpose of building a supercomputer is to provide superior performance on real applications. In this paper, we describe the performance of the Intel TFLOPS Supercomputer starting at the lowest level with a detailed investigation of the Pentium® Pro processor and the supporting memory subsystem.

Intel Corporation

Assessment of Residual Damage in Leadfree Electronics Subjected to Multiple Thermal Environments of Thermal Aging and Thermal Cycling

Technical Library | 2010-10-21 00:43:34.0

Electronic systems are often stored for long periods prior to deployment in the intended environment. Aging has been previously shown to effect the reliability and constitutive behavior of second-level leadfree interconnects.

Auburn University

High Voltage Chip Resistors

Technical Library | 2010-10-21 16:01:17.0

Many component engineers are faced with a circuit requirement calling for resistors having voltage ratings well above that associated with surface mount chip resistors, but below the level of conventional high voltage resistors which are generally availab

Ohmcraft

A Review of Test Methods and Classifications for Halogen-Free Soldering Materials

Technical Library | 2011-06-23 18:44:23.0

Over the last few years, there has been an increase in the evaluation and use of halogen-free soldering materials. In addition, there has been increased scrutiny into the level of halogens and refinement of the definition and testing of halogen-free solde

Indium Corporation

IPX3 IPX4 IPX5 IPX6 IPX9K Water Spray Test Chamber

Technical Library | 2019-06-17 02:34:44.0

Water spray test chamber dedicates to test and evaluate the protection degree to water resistance provided by product enclosure,the protection level against water ingress is called IP code.

Symor Instrument Equipment Co.,Ltd


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