Electronics Forum: hp3070 ict tester (Page 5 of 6)

X5R dielectric aging

Electronics Forum | Fri May 29 15:03:46 EDT 2009 | rway

We have recently begun using X5R dielectric capacitors. Although they have a better temperature coefficient over Y5V, they age much faster (5-7% logarithmically per decade). I assume the reason for using the X5R was the availability of the capacita

ICT

Electronics Forum | Sat Mar 10 08:05:09 EST 2007 | davef

Here's your test definitions [clipped from the dictionary in the fine SMTnet Library]: * Test, Automated. Computer controlled electrical testing of parts, assemblies, or finished products. * Test, Built-In (BIT). An electrical testing technique whi

Re: Flying Probe Testers?

Electronics Forum | Wed Aug 19 22:52:50 EDT 1998 | Dave F

| Good Day All!! | I hope ya'll had a decent weekend, I did...didn't do a damn thing, I like weekends like that. Anyways, the big guys here are thinking about buying a "Flying Probe" tester, and the G.M. came to me and asked what I thought of them.

New web site

Electronics Forum | Fri Sep 26 14:03:57 EDT 2003 | lysik

Good Idea. I think there are many Bad apple used equipment dealers as well. We should track them as well. Every bad apple needs to be dealt with. OEM must make money to survive and support systems. But I must tell you for example I have found many th

Don't understand the test results of an In-Circuit Tester

Electronics Forum | Sat Nov 19 03:15:39 EST 2016 | sarason

Does the file come off of an ICT. Next question is it an AGinet/HP/Keysight 3070. If so you have a chance at finding out the format. It is probably posted online in the Keysight manual downloads section. I might still have an old paper copy of this

smd capacitors- ICT measuring

Electronics Forum | Fri Jun 14 12:00:10 EDT 2013 | rgduval

Is this a new assembly/new test fixture/program? Or is this an existing assembly that is suddenly exhibiting this failure? Capacitors measured in circuit will not necessarily measure their correct values. Active components in circuit will be affec

ICT testing to improve yields

Electronics Forum | Mon Aug 27 08:36:52 EDT 2012 | rway

The process is currently being performed by hand. > I am trying to automate the process by switching > to pick and place equipment and using > AOI. > > Problem number one is getting my customer > to sign off on switching from hand assembly to >

Re: un-tested assembled circuit reject rates

Electronics Forum | Tue Dec 07 14:21:41 EST 1999 | Brian W.

In my experience, the most commonly accepted theory is that 100% inspection is only 80% effective AT BEST. That means that if your inspoectors are happy, noy outside concerns, well-rested, etc, they will catch 80% of the defects. This number goes d

Re: Who Are The X-Men?

Electronics Forum | Mon Oct 19 12:03:09 EDT 1998 | Scott Cook

Out of interest, are you using an 84V? 84VZ? a 60V? 60VZ? With SBIP or the Yamaha vision system (VICS 1000)? Do you have the old tray sequencer? > WRONG!!!! Why do folks still live in this mindset? I'm not slamming you personally. But this is preva

Re: Who Are The X-Men?

Electronics Forum | Wed Oct 21 21:27:32 EDT 1998 | smd

| | WRONG!!!! | Why do folks still live in this mindset? I'm not slamming you personally. But this is prevalent in our industry. | More opinion: | Make REWORK a nasty, dirty word. Work for the ROOT cause of a process problem. DO NOT ACCEPT rework a


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