Determine why product fails in the field by reviewing process checkpoints
PROCESS SCIENCES, INC. (PSI) Visit our main Laboratory Services page for more information. Failure Analysis, Material & Process Qualification. We are an analytical services laboratory dedicated to the electronic circuit assembly, printed circu
New Equipment | Surface Finish
The Phantom RIE is designed to supply research and failure analysis laboratories with state-of-the-art plasma etch capability using single wafers, dies or parts using fluorine and oxygen based chemistries. The system has a compact, modular design bui
The Revolution is the easiest to use, most cost effective, high quality inspection system on the market. The Revolution is designed specifically for use on production lines and in failure analysis laboratories. Intuitive so
Failure Analysis and general laboratory investigations of electronic components and devices, plus material analysis. Ideally suited for high precision scanning of high density devices.
Visit our main X-ray Inspection page for more information. PSI uses our two Nikon (X-Tek) Revolution X-ray station to provide real-time, off-axis X-ray. These systems are designed specifically for inspection of PCBAs and array devices, whether on pr
The experience and knowledge of STI’s Analytical Laboratory personnel enables interpretation of test results and reporting that lets our customers make the right choices for corrective actions. Services include Qualification testing, Visual Inspecti
New Equipment | Test Equipment
The TherMoiré® PS600S is a metrology solution that utilizes the shadow moiré measurement technique combined with automated phase-stepping to characterize out-of-plane displacement for samples up to 600 mm x 600 mm. With time-temperature profiling cap
500x magnification ,5 axis manipulator and advanced image processing. The JewelBox Ultra Compact delivers superior image quality with excellent resolution and sensitivity for laboratory and failure analysis applications. The system's high-resolutio
New Equipment | Test Equipment
The AKM600P is a metrology solution that utilizes the shadow moiré measurement technique combined with automated phase-stepping to characterize out-of-plane displacement for wafers or panels up to 600 mm x 600 mm. With time-temperature profiling capa
