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C3 Critical Cleanliness Control

C3 Critical Cleanliness Control

New Equipment | Test Equipment

Localized Electronics Cleanliness Tester and Residue Extractor The information gathered when using the C3 is intended to provide a measure of the cleanliness of a localized region of a circuit board. In addition, the C3 extracts a sample of the effl

UM Technology Co., Ltd.

Material Lab Technician

Career Center | Milpitas, California USA | Engineering,Production,Quality Control,Research and Development,Technical Support

Winslow Automation, Inc. (aka Six Sigma), an industry leader in electronic component interconnect technology & related test and failure analysis services, is seeking individuals specializing in materials lab testing to join our team. We have openin

Winslow Automation (aka Six Sigma)

Whisker Formation Induced by Component and Assembly Ionic Contamination

Technical Library | 2023-02-13 18:56:42.0

This paper describes the results of an intensive whisker formation study on Pb-free assemblies with different levels of cleanliness. Thirteen types of as-received surface-mount and pin-through-hole components were cleaned and intentionally contaminated with solutions containing chloride, sulfate, bromide, and nitrate. Then the parts were assembled on double-sided boards that were also cleaned or intentionally contaminated with three fluxes having different halide contents. The assemblies were subjected to high-temperature/high-humidity testing (85_C/85% RH). Periodic examination found that contamination triggered whisker formation on both exposed tin and solder fillets. Whisker occurrence and parameters depending on the type and level of contamination are discussed. Cross-sections were used to assess the metallurgical aspects of whisker formation and the microstructural changes occurring during corrosion.

Celestica Corporation

Validity of the IPC R.O.S.E. Method 2.3.25 Researched

Technical Library | 2010-06-10 21:01:48.0

This paper researches the effectiveness of the R.O.S.E. cleanliness testing process for dissolving and measuring ionic contaminants from boards soldered with no-clean and lead-free flux technologies.

KYZEN Corporation

Quality Inspector

Career Center | Milpitas, California USA | Production,Quality Control

Winslow Automation, Inc. (aka Six Sigma), an industry leader in electronic component interconnect technology & related test and failure analysis services, is seeking an experienced, detail-oriented, quality-conscious team player for our Quality Assur

Winslow Automation (aka Six Sigma)

Austin American Technology Aqua ROSE™ Batch Circuit Cleaner / Tester Systems

Austin American Technology Aqua ROSE™ Batch Circuit Cleaner / Tester Systems

New Equipment | Cleaning Equipment

WORLD’S FIRST AQUEOUS CLEANER / TESTER The Aqua ROSE™, from Austin American Technology, introduces a new era to batch cleaning / Ionic Contamination Testing. Now experience a batch cleaner that offers multiple cleaning and testing technologies for c

Austin American Technology

Monitors Keep Track of PCB Contamination

Industry News | 2003-06-04 09:11:10.0

Concoat Systems has further expanded and enhanced its CM range of contamination testers (or contaminometers).

Concoat Ltd.

Selective Soldering System-H

New Equipment | Selective Soldering

Selective Soldering System-H Specifications: MODEL HPS 4/46 HPS 4/35S Equipment parameters Dimension(L×W×H) 2450x1845x1565 (mm) 2450 x 2055 x 1665 (mm)

Samtronik International Limited

Characterization, Prevention and Removal of Particulate Matter on Printed Circuit Boards

Technical Library | 2016-12-22 16:44:04.0

Particulate matter contamination is known to become wet and therefore ionically conductive and corrosive if the humidity in the environment rises above the deliquescence relative humidity (DRH) of the particulate matter. In wet condition, particulate matter can electrically bridge closely spaced features on printed circuit boards (PCBs), leading to their electrical failure. (...) The objective of this paper is to develop and describe a practical, routine means of measuring the DRH of minute quantities of particulate matter (1 mg or less) found on PCBs.

IBM Corporation

Failure Analysis – Using Ion Chromatography And Ion Chromatography/Mass Spec (IC/MS)

Technical Library | 2021-04-29 01:43:34.0

Since the 1980s the electronics industry has utilized ion chromatography (IC) analysis to understand the relationship of ions, and some organics, to product reliability. From component and board fabrication to complete electronic assemblies and their end-use environment, IC analysis has been the de facto method for evaluating ionic cleanliness of electronic hardware.

Foresite Inc.


ionics searches for Companies, Equipment, Machines, Suppliers & Information

SMT feeders

Benchtop Fluid Dispenser
pressure curing ovens

Software programs for SMT placement and AOI Inspection machines from CAD or Gerber.
convection smt reflow ovens

World's Best Reflow Oven Customizable for Unique Applications