New Equipment | Test Equipment
The FiS 640 is designed to be a cost efficient, modular and expandable tester. This system can be configured with up to 1,024 pins. The tester’s operating system is MS Windows and the FiS 640 can be easily networked for centralized program storage or
New Equipment | Test Equipment
The iCT7000 is the ideal tester for those requiring a larger test node capacity. This system offers the same functionality and options as the FiS 640 tester but with an expandable pin count to 8,192 pins. Larger configurations require a more spacious
Demonstration of JTAG Live™ CoreCommander software. CoreCommander offers JTAG control of µprocessors, and DSPs via core debug access. The tool's routines take control of key processor core (e.g. ARM, PPC, X-scale, Cortex etc.) functions using the bui
Industry News | 2016-11-09 18:32:18.0
JTAG Technologies, the leading specialist in JTAG/boundary-scan solutions for board testing and device programming are excited to introduce their new collaborative product with Altium – JTAG Maps.
New Equipment | Test Equipment
Non-multiplexed In-Circuit Test, Functional Test, Boundary Scan and Flash Programming Capability. Highest Throughput and Highest Quality Test Non-Multiplexed to 3,456 pins Fast Test Program Generation Safe Back-Driving 10V and Low Voltage Driv
New Equipment | Test Equipment
The new COMPACT Line collects the inheritance and success of the historic line of SEICA in-circuit and functional testers, designed meeting the requirements of the so called “lean production”, with a specific attention to the requirements of the prod
New Equipment | Test Equipment
High Pin Count, High Performance Tester, Non-multiplexed pin structure, In-Circuit Test, On-Board Programming, IEEE, PXI, Boundary Scan. With the continuous and fast pace of development in the electronic manufacturing the time from design to produc
TSL provides manufacturers with contract engineering � from one day to six months, applications training for test engineering staff, and consulting for maximum efficiency of your ICT test cell. TSL provides playpen fixtures and personality cards for
New Equipment | Test Equipment
SPEA 4060 with integrated Goepel CASCON JTAG/Boundary Scan; SPEA 4040 - We are the West Coast Demonstration Facility for SPEA America, our partners in flying probe testing since 2003. We can perform programming and testing at our facility. We ca
New Equipment | Test Equipment
It is a simple stable and hi-speed In-circuit tester. It will provide efficient /full debug and high test coverage solution.It is a simple stable and hi-speed In-circuit tester. It will provide efficient /full debug and high test coverage solution.
Major in whole line of SMT equipment, especially in Mounting And printing and AOI SPI, Serve Parts and acceccories.
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