On the Automated Optical Inspection (AOI) front, Agilent continues to lead the way with its all new Medalist sj5000 AOI platform. First introduced at Productronica in November for post-reflow inspection, we have implemented new software features to extend its inspection capabilities. The sj5000 is one of the most flexible AOI systems in the industry today and can be deployed easily into various SMT line configurations. The platform comes with a 4 mega-pixel 60fps inspection system, with scalability from 11-21 microns per pixel resolution, and a multi-colored structured LED light source. Our inspection capability is enhanced through our new precision linear gantry, with 1 micron resolution and our latest inspection algorithms. The sj5000 provides improved field supportability and reliability. Come see it for yourself!
Agilent is committed to bringing the most comprehensive suite of test and inspection solutions to the market, to help our customers accelerate their success in this challenging market. Apart from the new products, we invite visitors to join us in our APEX booth and experience our other leading-edge test and inspection solutions, including the following:
Medalist x6000 - fastest 3D automated x-ray inspection providing uncompromised defect coverage at line rate speeds
Medalist i1000 - low-cost in-circuit test solution providing manufacturers the perfect fit with just enough test
Medalist SP50 Series 3 - capable of testing components down to 01005, with accurate and repeatable 3D volumetric measurements at blazing speed!
Agilent�s sales and technical experts will be on hand at APEX 2008 to help manufacturers with questions and offer advice on the best test and inspection strategy for their respective needs.
More information available at the Agilent Medalist Printed Circuit Board Test and Inspection Solutions website: http://www.agilent.com/find/pcb