News Releases from Mechanical Devices
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4 news releases added by Mechanical Devices
Company Information:
New Generation of Thermal Solutions G4
Apr 16, 2019 | Innovative Solutions, test your IC Device with confidence without ever worrying about temperature requirements
New Era in Testing DUT over Temperature
May 13, 2016 | The process of manufacturing and qualifying IC's consists of many steps while Temperature forcing systems play a crucial role in the final testing process. These environmental tests assure quality and reliability by stressing the device on one hand as well as helping to characterize and validate it on the other hand (making sure manufacturing outcome meets the design requirements). At later stages the temperature testing can support failure analysis effort and root cause analysis. AS common practice we are dealing with few different kinds of temperature forcing systems: Chambers, Thermal Stream systems and Direct Thermal Head systems. In this article I would like to focus on the practical aspects of utilizing Thermal Stream systems and Direct Thermal Head systems.
New Era in Testing DUT over Temperature
May 13, 2016 | The process of manufacturing and qualifying IC's consists of many steps while Temperature forcing systems play a crucial role in the final testing process. These environmental tests assure quality and reliability by stressing the device on one hand as well as helping to characterize and validate it on the other hand (making sure manufacturing outcome meets the design requirements). At later stages the temperature testing can support failure analysis effort and root cause analysis. AS common practice we are dealing with few different kinds of temperature forcing systems: Chambers, Thermal Stream systems and Direct Thermal Head systems. In this article I would like to focus on the practical aspects of utilizing Thermal Stream systems and Direct Thermal Head systems.
Thermal Control Units for IC Testing
Mar 14, 2016 | A better choice in thermal-forcing technology for Semiconductors IC Testing, Characterization, Validation, Reliability, FA, ATE and Production.
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