News Releases from Multitest Elektronische Systeme GmbH
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135 news releases added by Multitest Elektronische Systeme GmbH
Company Information:
Multitest Launches Optimal Contactor for High-End Digital Applications
Mar 07, 2012 | Multitest recently launched the newest member of the Quad Tech™ contactor family: the Triton™ contactor for high-end digital applications.
Increase PCB Lifetime by up to 100 Percent - Multitest's DuraPad™ Significantly Reduces Pad Wear
Feb 16, 2012 | Multitest announces that its proprietary DuraPad™ surface has been proven to significantly reduce the effects of pad wear caused by pogo pin style contactors.
Multitest's Engineering Expert to Present Breaking Research at BiTS 2012
Feb 10, 2012 | Multitest announces that Ryan Satrom, RF Engineer, will present a paper titled “Improving Power Delivery In The Test Interface” at the upcoming Burn-in & Test Socket Workshop.
Multitest's Product Manager to Discuss Specmanship at BiTS 2012
Feb 07, 2012 | Multitest announces that Jim Brandes, Product Manager, will hold a presentation titled “Specmanship” at the upcoming Burn-in & Test Socket Workshop, scheduled to take place March 4-7, 2012 Mesa, AZ.
Multitest to Exhibit New Test Solutions at BiTS 2012
Feb 06, 2012 | Multitest will exhibit its leading test solutions at the upcoming Burn-In & Test Strategies Workshop, scheduled to take place March 4-7, 2012 in Mesa, AZ.
Multitest Ships First MT9510 x16
Feb 03, 2012 | Multitest announces the first shipment of its new tri-temp 16-site pick-and-place platform. The MT9510 x16 will be deployed at an Asian high-volume test site
Multitest MEMS Test and Calibration Equipment Now Available for MT9510 Pick-and-Place Test Handler
Jan 13, 2012 | Multitest has shipped the first Multitest MEMS equipment for the MT9510 pick-and-place test handler to an IDM in the United States. This new combination is based on the two well-established platforms: MT MEMS and MT9510.
Multitest's UltraFlat™ Process Meets Requirements of High Parallel Vertical Probe Card Applications
Jan 05, 2012 | Multitest announces that its UltraFlat™ process meets the requirements of high parallel vertical probe card applications.
Multitest Offers MT Pro Support Program
Dec 19, 2011 | Multitest introduces the MT Pro Support Program for complete after-sales support.
Multitest's 2012 Training Schedule Is Now Available
Dec 12, 2011 | Multitest announces that its 2012 training schedule now is available online.
Multitest Appoints New VP of Global Sales & Marketing
Dec 07, 2011 | Multitest announces that James Quinn was named Vice President of Global Sales & Marketing effective November 14, 2011.
Multitest's Gemini™ Kelvin Is the Contactor of Choice for QFNs and BGAs
Nov 27, 2011 | Multitest announces that the usage of its Gemini™ Kelvin is rapidly increasing at two longstanding customers, both of which rank among the top 25 IDMs.
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Multitest Offers Leading Cantilever Technology for All Handler Brands
Nov 10, 2011 | Multitest announces that its Cantilever style contactors often are used on non-Multitest, third-party test handlers.
Multitest's Mercury™ Proves Lowest Cost of Test
Nov 03, 2011 | Multitest announces that the Mercury™ contactor proved its excellent performance during a thorough BGA test evaluation at an international IDM and is now on the list of qualified contactors for all business units.
Multitest's Quad Tech™ Is Designed for Best Contacting Integrity
Oct 28, 2011 | Multitest announces that its Quad Tech™ concept is the next generation of vertical contact technology. Its superior test yield and long probe life results in significant cost of test advantages.
Multitest to Exhibit New Test Solutions at Silicon Valley Test Conference 2011
Oct 25, 2011 | Multitest will exhibit its leading test solutions at the upcoming SV Test Conference
Test Interface Boards – Multitest Meets Today'Fine-Pitch Requirements
Oct 12, 2011 | Multitest announces that the Santa Clara board fab has refined its pulse plating process to integrate it into Multitest’s fabrication process to further enhance the high aspect ratio capability.
Multitest MT9928 XM Gravity Test Handler Chosen as Strategic Platform
Oct 05, 2011 | Multitest announces that its well-established MT9928 XM Gravity Test Handler recently outperformed two major competitors during an extensive evaluation at a key player in semiconductor production.
Multitest to Exhibit New Test Solutions at SEMICON Europa 2011
Oct 03, 2011 | Multitest will exhibit its leading test solutions in Booth #1.342 at the upcoming SEMICON Europa,
Multitest's MT2168 Optimizes for Cost and Throughput — Even for Less than 16 Sites
Sep 28, 2011 | Multitest announces that the MT2168 fully leverages today’s tester capabilities in terms of shorter test times and higher parallelism, e.g. 16 sites.
Leveraging Temperature Test Expertise: Multitest MT9928 xm deployed for calibration of MEMS oscillators
Sep 23, 2011 | Multitest announces that its MT9928 tri-temp test handler was chosen for a novel MEMS oscillator application that requires the most accurate temperature calibration.
MEMS Test and Calibration: Multitest ships first InPhone system for high parallel microphone test
Sep 19, 2011 | Multitest has shipped the first InPhone system to a European site of a major IDM.
Post-Assembly Test for PCBs - Multitest expands test capacities for fully assembled load boards
Sep 07, 2011 | Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, has expanded its post-assembly, flying probe test capacity to meet the growing demands of PCB assembly.
Leading-Edge Auto-Alignment Concept: Multitest's MT2168 Features Superior Placement Accuracy
Sep 01, 2011 | Multitest announces that its MT2168 has proven its superior placement concept at a high-volume production site in Asia. The customer experienced a significant improvement in the placement rate of tested devices in the output tray.
Multitest to Exhibit New Test Solutions at the International Test Conference (ITC)
Sep 01, 2011 | Multitest will showcase its leading test solutions in Booth #313 at the upcoming International Test Conference (ITC).
Market Values Multitest Burn-in Expertise: Multiple Repeat Order for Multitest Burn-in Boards
Aug 24, 2011 | Multitest’s Burn-in Product Group has received a multiple repeat order for burn-in boards from a large European IDM for automotive devices.
Substantial Test Yield Improvement: Multitest’s Mercury™ provides better yields by up to six percentage points
Aug 18, 2011 | Multitest announces that its Mercury™ contactor, recognized for its excellent electrical and mechanical performance, proved its leading features in a head-to-head evaluation against another established contactor of an incumbent Asian competitor.
Using Experience to Meet Today's Challenges: MT9510 x16 Pick-and-Place Handler
Aug 10, 2011 | Multitest introduces MT9510 x16, a new 16-site tri-temp pick-and-place handler.
53712Multitest Introduces New MEMS Test and Calibration Equipment: MT MEMS Expands into 3-D Earth Magnetic Field
Aug 02, 2011 | Multitest has successfully added a new application to its MEMS test and calibration product line. With the new application, 3-D earth magnetic field sensors can be used for innovative mobile applications and state-of-the-art navigation applications without the use of a GPS.
Multitest Names New President
Jul 13, 2011 | Multitest announces that Reinhart Richter has been promoted to President of the Multitest Group effective immediately.
Multitest's Dura® Kelvin Reduces Overall Cost of Test
Jul 06, 2011 | Multiest announces that its Dura®Kelvin contactors again have proven their reputation for outstanding lifetime and cleaning cycles. At an international IDM's high-volume production site, the Dura®Kelvin contactor substantially contributed to reducing the overall cost of test.
Multitest's Mercury™ Contactor: Outstanding Lifetime for WLSCP Test
Jun 16, 2011 | Multitest announces that its installed base of WLCSP contactors is steadily growing. The contactors are running high-volume production at subcontractors in China, Taiwan, Singapore and other locations. They show outstanding lifetime performance, contributing to unreached cost of test.
Optimizing for Test Cell Throughput: Multitest’s MT2168 Fully Leverages Advanced Tester Capabilities
Jun 09, 2011 | Multitest announces that its MT2168 is designed for best tester utilization. Short index time (DUT exchange time), fast loading and sorting, and a high soak capacity support the handler to keep pace with the new tester generation.
Test in Carriers: New Customer for the Multitest InCarrier®
Jun 07, 2011 | Multitest has received another order for its unique InCarrier® test equipment from a major test house in Asia. The InCarrier® was preferred against standard singulated package test as well as other methods of high parallel test.
Multitest to Hold Open House during SEMICON West 2011
Jun 01, 2011 | Multitest will hold an Open House during the upcoming SEMICON West exhibition at its Santa Clara, CA facility located at 3021 Kenneth Street. The Open House will be open daily July 12-14, 2011 from 10 a.m.-4 p.m.
Save Cost Without Sacrificing Flexibility: The scalable design of Multitest’s MT2168 secures investment for the future
May 19, 2011 | Multitest announces that the scalable design of the MT2168 allows users to adjust the base unit configuration to the actual requirements – not only at the initial installation, but also later, e.g. if the MT2168 is moved from engineering to a high-volume site.
Manage Power Dissipation During Test: Multitest’s MT9510 Provides Extended Temperature Control with XTC
May 06, 2011 | Multitest announces that the MT9510 now provides extended temperature control with its extended temperature calibration (XTC).
Proven Best Cost of Test: Multitest’s ECON® Contactor Exceeds 4.5 mio Insertions
Apr 20, 2011 | Multitest announces that its well-established ECON® contactor once again has proven its superior cost of test. The contactor recently exceeded 4.5 mio insertions at an Asian test house.
Multitest Provides Reliable Innovation for Next Generation Burn-in Test
Apr 07, 2011 | Multitest announces that its burn-in product team recently successfully supported an international IDM to significantly increase its burn-in capacity by more than one third, while substantially reducing the cost and effort required for incoming board inspection at the customer’s site.
Sigurd Corporation Chooses Multitest’s MT2168
Mar 31, 2011 | Multitest congratulates Sigurd Microelectronics Corporation (Sigurd) for being the first user of the innovative MT2168 pick-and-place handler in volume production in Taiwan.
Optimizing Test Yield: Multitest’s MT2168 Ensures Best Positioning Accuracy
Mar 23, 2011 | Multitest announces that its MT2168 pick-and-place handler offers significant yield advantages based on its unique and industry-leading positioning concept.
Multitest’s Mercury Contactors for Wafer-Level Test Successfully Deployed to Subcontractors in Asia
Mar 10, 2011 | Multitest announces that another major fabless semiconductor manufacturer has evaluated and approved its Mercury-based wafer-level contactors. These Mercury contactors have eight sites and more than spring probes per site.
Designed for Best Production Flow: Multitest’sMT2168 Shows Best Jam Performance in the Field
Mar 03, 2011 | Multitest announces that its MT2168 has proven its high production performance in the field. Best jam rate statistics are evidence of the successful new design concept.
Multitest’s InCarrier® for Test in Trays Is Valued by the Industry
Feb 22, 2011 | Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, has received its fifth full purchase order for its InCarrier® device transfer system with InStrip® test handling system adapted to metal frame-based carriers.
Multitest’s Engineering Experts to Discuss Tri-Temperature Test at BiTS 2011
Feb 17, 2011 | Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that Ryan Satrom, RF Engineer, and Paul Hurst, Engineering Manager, will present a paper titled "A Single Source Solution for a 26GHz, Tri-Temperature Test Cell" at the upcoming Burn-in & Test Socket Workshop, scheduled to take place March 6-9, 2011 at the Hilton Phoenix East/Mesa Hotel in Mesa, AZ.
Multitest to Exhibit New Test Solutions at BiTS 2011
Feb 14, 2011 | Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, will exhibit its leading test solutions in Booth A45 at the upcoming Burn-in & Test Socket Workshop, scheduled to take place March 6-9, 2011 at the Hilton Phoenix East/Mesa Hotel in Mesa, AZ.
Multitest Engineers to Hold Tutorial during BiTS 2011
Feb 09, 2011 | Multitest announces that Ryan Satrom, RF Engineer, and Jason Mroczkowski, RF Engineering and Product Manager, will hold a tutorial titled "Signal and Power Integrity in the Test Interface" at the upcoming Burn-in & Test Socket Workshop, scheduled to take place March 6-9, 2011 at the Hilton Phoenix East/Mesa Hotel in Mesa, AZ.
Multitest’s Chris Cuda to Discuss Pros and Cons of ATE Boards at BiTS 2011
Feb 07, 2011 | Multitest announces that Chris Cuda, US Product Manager, will present a paper titled "Benefits & Risks of High Aspect Ratio Vias in ATE Boards" at the upcoming Burn-in & Test Socket Workshop, scheduled to take place March 6-9, 2011 at the Hilton Phoenix East/Mesa Hotel in Mesa, Arizona.
Proven Tri-Temp Performance: Multitest’s MT9510 is the Leader in Stability and Accuracy
Feb 04, 2011 | Multitest announces that its MT9510 tri-temp pick-and place handler has once again proven its capability in temperature, accuracy and stability.
Multitest Experts to Present PCB Pad Wear Analysis Findings at BiTS 2011
Feb 03, 2011 | Multitest announces that Valts Treibergs, R&D Engineering Manager, and Chris Cuda, US Product Manager, will present "PCB Pad Wear Analysis at 0.4 mm Pitch ― the Story Continues…" at the upcoming Burn-in & Test Socket Workshop, scheduled to take place March 6-9, 2011 at the Hilton Phoenix East/Mesa Hotel in Mesa, AZ.
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