News Releases from Multitest Elektronische Systeme GmbH
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135 news releases added by Multitest Elektronische Systeme GmbH
Company Information:
Multitest ecoAmp Kelvin: Approved Contactor for Automotive High Volume Production Major IDM selects ecoAmp Kelvin Contactor for high power testing
Mar 29, 2018 | Multitest’s ecoAmp Kelvin Contactor successfully passed an in-depth evaluation phase at a major IDM. Based on the performance, which was demonstrated in a challenging high power application, the customer decided to make the Multitest ecoAmp Kelvin Contactor their strategic test interface product for existing and future high power test applications at high volume production.
Multitest Sensor Test Modules Ready for Increased Productions Needs Optimizing 6DOF Gyro Test of Singulated Packages
Mar 13, 2018 | Multitest has been the market leader for MEMS/sensor test and calibration equipment for more than 15 years. Multitest has now launched the next generation of its 6DOF gyro test module for singulated packages, which provides significant production benefits resulting in even lower cost of test, enhanced test accuracy and higher daily output.
Meet the Multitest Experts at the EUROPEAN 3D TSV SUMMIT
Dec 16, 2013 | Multitest, announces that experts for 3D IC test will present at the European 3D TSV Summit in Grenoble, Jan 20-22, 2014.
Profitable Innovation Requires Reliable Equipment Google Chromecast IC is tested on Multitest’s proven MT9928 Gravity Test Handler
Dec 02, 2013 | Multitest announces that its MT9928 Gravity Feed Handler has been selected to support the Google Chromecast-related production by a leading semiconductor company.
Innovative Sensors Require Advanced Test Equipment Multitest ships first MEMS tri-temp solution for 3+2 axis magnetic test and calibration
Nov 25, 2013 | Multitest announces that its leading solution for 3-axis magnetometer plus 2-axis low g-test and calibration fully supports the technical features of today’s advanced 3D hall sensors.
25 Percent Cost of Test Improvement – Mercury Contactor Outperforms Competition
Nov 18, 2013 | Multitest announces that its Mercury 040 Spring Probe Contactor has successfully passed more than five months of evaluation for a strip test application at a SEA high-volume production site.
MT2168 – Successful Evaluation Proves Superior Performance Multitest’s innovative architecture ensures best results
Nov 11, 2013 | Multitest announces that it received the official data from an evaluation of the MT2168 that confirms the superior performance of the MT2168 pick-and-place handler.
Beyond Plug & Yield® - Multitest is acquired by LTX-Credence Bringing Tester, Handlers and Interfaces together
Sep 09, 2013 | LTX-Credence Corporation (Nasdaq:LTXC), announced an important step in the evolution of the semiconductor test cell with an agreement to acquire Multitest and Everett Charles Technologies (ECT) from Dover Corporation (NYSE:DOV).
Multitest MT9510 Pick-and-Place Handler Meets the Requirements of ICs for Connectivity and Cloud Servers
Aug 22, 2013 | Multitest announces that due to mobility and the related demand for connectivity, the data volume in cloud servers is significantly growing.
Mobility Drives Electronics: Multitest’s Solutions for Efficient Test
Jul 15, 2013 | Mobility is the driving force in electronics.
Chat with Multitest’s Experts at SEMI TechHub – The New SEMICON West Format
Jul 01, 2013 | Multitest announces that Bernhard Lorenz, VP Engineering, will lead an expert discussion at the TechHub “Test” of SEMICON West exhibition & conference, scheduled to take place July 9-11, 2013 at the Moscone Center in San Francisco, CA.
Multitest at Test Vision 2020: Minimize Cost of Calibration and Test for Sensors
Jun 25, 2013 | Multitest, announces that Klaus Ruhmer will present at Test Vision 2020, in conjunction with SEMICON West, scheduled to take place July 10-11, 2013 at the San Francisco Marriott Marquis.
Join Multitest’s James Quinn for a Discussion about Quality in 3D Assembly at SEMICON West
Jun 18, 2013 | Multitest, announces that James Quinn will present during the 2013 SEMICON West exhibition & conference, scheduled to take place July 9-11, 2013 at the Moscone Center in San Francisco, CA.
Multitest to Discuss Solutions for Mobility during Annual Open House Week
Jun 13, 2013 | Multitest,, today announced that it will hold its annual Open House Week July 9-11, 2013.
Signal Integrity Engineer at Multitest to Present PCB Material Analysis at IEEE Semiconductor Workshop in San Diego
May 31, 2013 | Multitest,announces that Jason Mroczkowski, Signal Integrity Engineer, will present at the upcoming The IEEE Semiconductor Wafer Test Workshop in San Diego, CA. The presentation entitled, “High Frequency PCB Material Analysis,” is scheduled to take place Wednesday, June 12, 2013 from 10:30-11 a.m.
Continuous Innovation in Packaging and Manufacturing Processes: How to ensure best quality and process control at competitive cost?
May 14, 2013 | Multitest offers innovative approaches for test strategies of 3D ICs and Sensors – Meet Multitest at ECTC, May 28-30, Las Vegas
Multitest’s James Quinn to Give Keynote Presentation during IPC ESTC 2013
May 03, 2013 | Multitest,announces that James Quinn, VP of Sales & Marketing, will be a keynote speaker at the upcoming IPC Electronic System Technologies Conference & Exhibition (ESTC), scheduled to take place May 20-23, 2013 at The New Tropicana in Las Vegas, Nevada.
Multitest ecoAmp™: Kelvin Contactor for High-Power Applications Proves Performance
May 02, 2013 | Multitest, announces that its ecoAmp™ high-power Kelvin contactor successfully passed a challenging evaluation for an automotive application at an European-based IDM.
Make It Fast – Make It Easy with Multitest’s MT9510 Access+ Contacting Unit Holder
Apr 18, 2013 | Multitest, announces that the new Access+ contact unit holder (CUH) for the MT9510 significantly shortens the downtime of the test cell.
Meet Multitest at TUG 2013
Apr 11, 2013 | Multitest, will present at the Teradyne Users Group Conference, scheduled to take place April 29-May 1, 2013 in Fort Worth, TX. Meet Multitest’s experts to learn more about the company’s solutions, from wafer-level test to final test – for standard ICs and sensor packages.
Creating True Value with Multitest at VOICE 2013
Mar 28, 2013 | Multitest, will present at the VOICE conference, scheduled to take place April 23-25, 2013 at the DoubleTree by Hilton Hotel in San Jose, CA. Meet Multitest’s experts to learn more about the company’s solutions, from wafer-level test to final test – for standard ICs and sensor packages.
Multitest Announces Survey Drawing Winner
Mar 21, 2013 | Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, congratulates Mr. Rafael Reyes, the winner of its recent drawing. All survey participants were entered into a drawing for an iPad mini.
Melexis Chooses Multitest’s MT9510 Test Handler for Gesture Recognition IC
Mar 01, 2013 | Melexis, a mixed signal semiconductor manufacturer headquartered in Belgium, has chosen Multitest’s Standard MT9510 Pick and Place Test Handler for an infrared, light sensing application
Multitest to Exhibit Integrated Test Solutions at BiTS 2013
Feb 27, 2013 | Multitest, will exhibit in Booth #K4 at the Burn-in & Test Strategies Workshop (BiTS), scheduled to take place March 3-6, 2013 in Mesa, AZ.
Multitest’s Solution for 3D Packages
Feb 21, 2013 | Multitest, announces that it has been awarded a 2013 NPI Award from Circuits Assembly magazine in the category of Test & Inspection – Functional Test for its InStrip 3D.
EUROPEAN 3D TSV SUMMIT: Join the Presentation by Multitest Experts
Dec 19, 2012 | Multitest, is proud to present a paper during the European 3D TSV Summit (Grenoble - Jan 22-23, 2013).
Get Trained For Highest Efficiency: Multitest’s 2013 Training Schedule Now Available Online
Dec 14, 2012 | Multitestannounces that its 2013 training schedule is now available online.
MEMS Oscillators - Great Growth Potential and Superior Performance Multitest Equipment Fully Supports the Advantages
Dec 04, 2012 | Multitestannounces that its equipment fully supports the advantages of MEMS Oscillators.
Multitest’s MT9510 x16 Proves Best Temperature Accuracy High Parallel Test Must Not Jeopardize Temperature Performance
Nov 06, 2012 | Multitest, announces that its MT9510 x16 has proven its outstanding temperature accuracy of ±2.0°C at an Asian high-volume production site.
Multitest’s Q-Tip for Mercury™ Contactor Offers the Best First Pass Yield over the Full Tri-Temp Range
Oct 22, 2012 | Multitest announces that its Mercury™ contactor with Q-tip successfully passed a two-month evaluation at a US-based IDM with test operations in Southeast Asia with excellent first-pass yield for more than 500k insertions.
Powerful Performance Is Required: MT2168 for High-Power Applications
Oct 05, 2012 | Multitest, announces that its MT2168 pick-and-place handler has been selected for a challenging high-current application by an IDM that is leading in this segment.
Multitest Successfully Concludes Test Cell Docking and Mounting Working Group SEMI CAST Releases Test Cell Docking and Mounting Terminology Guide
Sep 28, 2012 | Multitest announces that Business Unit Manager Günther Jeserer chaired the Docking and Mounting Working Group conducted by the Collaborative Alliance for Semiconductor Test (CAST), which began its activities under the SEMI organization in 2008.
BlueLine™ Contactors: Highest Multitest Performance for Third-Party Test Handlers
Sep 19, 2012 | Multitest,announces that its BlueLine™ contactors make the high-performance Multitest cantilever contacting technology available for non-Multitest handlers as well.
BlueLine™ Contactors: Highest Multitest Performance for Third-Party Test Handlers
Sep 19, 2012 | Multitest,announces that its BlueLine™ contactors make the high-performance Multitest cantilever contacting technology available for non-Multitest handlers as well.
Professional Support for Highest Overall Equipment Efficiency Multitest offers wide range of service contracts
Aug 27, 2012 | Multitest, announces that its service contracts provide professional on-site support from Multitest experts
Test Interface Boards – Customers Appreciate Multitest Pulse Plating Process for Board Fab
Aug 20, 2012 | Multitest, announces that its Pulse Plating Process provides significant advantages in terms of fabrication cost and cycle time.
Test Interface Boards – Customers Appreciate Multitest Pulse Plating Process for Board Fab
Aug 20, 2012 | Multitest, announces that its Pulse Plating Process provides significant advantages in terms of fabrication cost and cycle time.
Full Device Traceability: Multitest’s MT2168 Now Features Integrated 2D Code Reader
Aug 08, 2012 | Multitest, now offers the MT2168 with optional 2D code reader to ensure 100 percent device traceability and lot integrity
Multitest at SEMICON Taiwan 2012: Leading Solutions for High Parallel Test of SoCs, MEMS and 3D Packages
Aug 02, 2012 | Multitest, will exhibit in booth #1185 at the upcoming SEMICON Taiwan Expo, scheduled to take place September 5-7, 2012 at the TWTC Nangand Hall in Taipei, Taiwan.
Expert Background: Multitest Introduces Signal Integrity and Power Glossary
Aug 01, 2012 | Multitest, introduces a Signal and Power Integrity Glossary. The new glossary, developed by Ryan Satrom, Multitest’s Signal Integrity Engineer, explains the major terms and concepts related to power integrity.
Multitest Offers Powerful Plug & Yield Solution for High Power Applications MT9928 Gravity Handler, ecoAmp Contactor and Multitest PCB
Jul 19, 2012 | Multitest, announces that its MT9928 gravity handler ideally supports the special features of the recently launched ecoAmp Kelvin contactor.
Multitest’s Solution for 3D Packages Released to Production Electrical test during the assembly process ensures best production yield
Jul 09, 2012 | Multitest announces that the first Multitest Plug & Yield solution for the test of 3D packages recently has been released to the customer’s production.
Multitest VP Bernhard Lorenz to Present at Test Vision 2020 Conference in Conjunction with SEMICON West
Jul 02, 2012 | Multitestannounces that VP Bernhard Lorenz will present at the upcoming Test Vision 2020 Conference,
Multitest’s InCarrier™ Is Now Available in a Wide Range of Loading and Unloading Configurations Stable and high parallel handling solutions for various applications
Jun 05, 2012 | Multitest, announces that its InCarrier™ Loader/Unloader is available in a variety of configurations, e.g. for loading from tube, bowl, tray and for unloading into tube, bulk or metal mag in any combination.
Multitest’s Bowl Feed Option for the MT9928 Is Well Accepted by the Market
May 17, 2012 | Multitest announces a new bowl feed module for the MT9928 xm gravity test handler.
Multitest ecoAmp™: New Kelvin Contactor for High-Power Applications
May 03, 2012 | Multitest announces the debut of its latest Kelvin contactor — a state-of-the-art solution for high-power applications of 500+ Amperes.
MT9928 Gravity Feed Test Handler – Multitest Ships Its 1800th Conversion Kit
Apr 19, 2012 | Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that it recently shipped the 1,800th conversion kit for its MT9928 xm highly modular gravity feed test handler.
Multitest InStrip® - Continuously growing installed base: Reliable high parallel handling solution for a broad range of applications
Apr 10, 2012 | Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that the InStrip® provides a high parallel test handling solution not only for ASICS and sensors in strips
Multitest Offers Comprehensive Tutorial for Kelvin Contactors
Mar 27, 2012 | Multitest now offers a Kelvin Tutorial. A Kelvin contactor is required for economical testing of devices with measurements that are sensitive to contact resistance. A true Kelvin contactor completely eliminates contact-resistance errors from DC parametric tests.
Multitest Leverages MT9510x16 for Quad-Site MEMS Applications
Mar 13, 2012 | Rosenheim, Germany, March 2012: Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that it has expanded its MEMS portfolio to pick-and-place applications with the introduction of its test and calibration cart for the MT9510. Multitest MEMS solutions now are available for strip test and singulated package test –on Multitest InStrip® with optional InCarrier™, the well-established gravity test handlers MT93xx and MT9928, or the MT9510XP tri-temp pick-and-place handler.
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