Technical Articles From JTAG Technologies B. V.
Read technical articles about electronics manufacturing added by JTAG Technologies B. V.
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2 technical articles added by JTAG Technologies B. V.
Company Information:
The Long-term Shaping of the JTAG/Boundary-scan Standards
May 11, 2015 | Peter van den Eijnden, MD JTAG Technologies.
Originating from the last millenium, almost three decades ago, the introduction of surface mount packaging triggered a wave of changes throughout many aspects of electronics production. A small number of talented, innovative test engineers from various big players of the industry started to attend meetings to discuss the impact of that change of technology on their future test concepts for modern assemblies. The Joint Test Action Group was born....
Testing Digital Designs – The Boundary-scan Balance
May 20, 2010 | James Stanbridge, Steve Lees
As several industry pundits have expressed in recent years: "the era of 'one test method fits all' seems well behind us." For most test managers with even a modest mix of products, trying to formulate a test policy/philosophy has become a tricky balancing act at the best of times. James Stanbridge, Sales Manager UK for JTAG Technologies, and Steve Lees Managing Director of ATE Solutions look at the options....
