The Morphology Evolution and Voiding of Solder Joints on QFN Central Pads with a Ni/Au Finish
Published: |
October 18, 2012 |
Author: |
Julie Silk, Jianbiao Pan, Mike Powers |
Abstract: |
First published in the 2012 IPC APEX EXPO technical conference proceedings. In this paper, we report on a comprehensive study regarding the morphology evolution and voiding of SnAgCu solder joints on the central pad of two different packages – QFN and an Agilent package called TOPS – on PCBs with a Ni/Au surface finish.... |
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