Technical Library: mycronic electrical test (Page 1 of 5)

Dam and Fill Dispensing for Medical

Technical Library | 2023-08-16 18:02:27.0

One of our customers in the medical industry requested dam and fill application testing on a Kapton substrate. The material needed to be non-conductive for dispensing around electrical components, acting as structural support. Ultimately the product will be folded, therefore the footprint had to be small.

GPD Global

Selective Solder Paste Deposition Reliability Test Results.

Technical Library | 2007-06-21 17:03:16.0

The rapid assimilation of Ball Grid Array (BGA) and other Area Array Package technology in the electronics industry is due to the fact that this package type allows for a greater I/O count in a smaller area while maintaining a pitch that allows for ease of manufacture (...) While there have been several studies comparing these two attachment methods, this study highlights the effect of rework technique on the electrical characteristics and reliability of reworked BGAs.

BEST Inc.

Ingress Protection (IP) test for electronic enclosure test

Technical Library | 2019-04-07 23:34:10.0

Ingress Protection Test Chamber is used to determine the protection degree of product enclosures,the protection level provided by the enclosure is called IP code,our IP test chamber compeletely follow the standard IEC60529 and others. IP protection grade is an important index of electrical equipment safety protection. Protective-grade systems such as ip, which provide a method of classifying products in terms of dust-proof, waterproof and anti-collision levels of electrical equipment and packaging, which have been recognized by most European countries, as drafted by the International Electrotechnical Association (iec (international electro technical commission). And announced in ied529 (bs en 60529 / 1992) outer packing protection grade (ip code). The level of protection is expressed in terms of IP followed by two numbers, which are used to define the level of protection. The first number indicates the extent of the equipment‘s resistance to dust, or the degree to which people are protected from harm in sealed environments. I represents a level that prevents solid foreign matter from entering, with a maximum level of 6; The second number indicates the extent to which the equipment is waterproof. P represents the level of protection against influent and the highest level is 8. Such as the protection level of the motor ip65. Contact electrical equipment protection and external material protection level (first digit) Electrical equipment waterproof protection level (second digit) . IP is the international code used to identify the protection grade ip grade consists of two numbers, the first number for dust, and the second number for waterproof, the larger the number means the better protection level.

Symor Instrument Equipment Co.,Ltd

IPC 9252A Electrical Test Considerations & Military Specifications versus Electrical Test

Technical Library | 2013-04-04 15:28:39.0

This paper will outline and define what requirements must be adhered to for the OEM community to truly achieve the IPC class product from the Electrical Test standpoint. This will include the test point optimization matrix, Isolation (shorts) parameters and Continuity (opens) parameters. This paper will also address the IPC Class III/A additional requirements for Aerospace and Military Avionics. The disconnect exists between OEMs understanding the requirements of their specific IPC class design versus the signature that will be presented from their design. This results in many Class III builds failing at Electrical Test... First published in the 2012 IPC APEX EXPO technical conference proceedings

Gardien Services USA

Investigation of Device Damage Due to Electrical Testing

Technical Library | 2012-12-14 14:28:20.0

This paper examines the potential failure mechanisms that can damage modern lowvoltage CMOS devices and their relationship to electrical testing. Failure mechanisms such as electrostatic discharge (ESD), CMOS latch-up, and transistor gate oxide degradation can occur as a result of electrical over-voltage stress (EOS). In this paper, EOS due to electrical testing is examined and an experiment is conducted using pulsed voltage waveforms corresponding to conditions encountered during in-circuit electrical testing. Experimental results indicate a correlation between amplitude and duration of the pulse waveform and device degradation due to one or more of the failure mechanisms.

Worcester Polytechnic Institute

Pad Cratering Susceptibility Testing with Acoustic Emission

Technical Library | 2015-08-13 15:52:40.0

Pad cratering has become more prevalent with the switch to lead free solders and lead free compatible laminates. This mainly is due to the use of higher reflow temperature, stiffer Pb-free solder alloys, and the more brittle Pb-free compatible laminates. However, pad cratering is difficult to detect by monitoring electric resistance since pad cratering initiates before an electrical failure occurs. Several methods have been developed to evaluate laminate materials' resistance to pad cratering. Pad-solder level tests include ball shear, ball pull and pin pull. The detailed methods for ball shear, ball pull, and pin pull testing are documented in an industry standard IPC-9708. Bansal, et al. proposed to use acoustic emission (AE) sensors to detect pad cratering during four-point bend test. Currently there is an industry-working group working on test guidelines for acoustic emission measurement during mechanical testing.

Agilent Technologies, Inc.

A Designed Experiment for the Influence of Copper Foils on Impedance, DC Line Resistance and Insertion Loss

Technical Library | 2013-03-28 16:18:22.0

For the last couple of years, the main concerns regarding the electrical performance of blank PCB boards were impedance and ohmic resistance. Just recently, the need to reduce insertion loss came up in discussions with blank board customers (...) The paper describes the test vehicle and the testing methodology and discusses in detail the electrical performance characteristics. The influence of the independent variables on the performance characteristics is presented. Finally the thermal reliability of the boards built applying different copper foils and oxide replacements was investigated.

Multek Inc.

Divergence in Test Results Using IPC Standard SIR and Ionic Contamination Measurements

Technical Library | 2017-07-13 16:16:27.0

Controlled humidity and temperature controlled surface insulation resistance (SIR) measurements of flux covered test vehicles, subject to a direct current (D.C.) bias voltage are recognized by a number of global standards organizations as the preferred method to determine if no clean solder paste and wave soldering flux residues are suitable for reliable electronic assemblies. The IPC, Japanese Industry Standard (JIS), Deutsches Institut fur Normung (DIN) and International Electrical Commission (IEC) all have industry reviewed standards using similar variations of this measurement. (...) This study will compare the results from testing two solder pastes using the IPC-J-STD-004B, IPC TM-650 2.6.3.7 surface insulation resistance test, and IPC TM-650 2.3.25 in an attempt to investigate the correlation of ROSE methods as predictors of electronic assembly electrical reliability.

Alpha Assembly Solutions

Hand Soldering, Electrical Overstress, and Electrostatic Discharge

Technical Library | 1999-05-09 13:07:16.0

This paper will give the reader a general understanding of EOS and ESD phenomena. It specifically addresses hand soldering's role in EOS and ESD and how to protect against and test for potential problems. It discusses how Metcal Systems address EOS and ESD concerns and how they differ from conventional soldering systems.

Metcal

Designing PCBs for Test and Inspection

Technical Library | 2012-12-14 14:17:56.0

This article provides practical and affordable Design-for- Test (DFT) and Design-for-Inspection (DFI) methods that will have a positive impact on product costs, yield, reliability, and time-to-market. The properties of testability (including controllability and observability) will be analysed as they relate to analogue and digital design rules and their cause/effect, as well as the electrical and physical characteristics of proper PCB design.

Teradyne

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