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Agilent 53310A-010-031 listed by Test Equipment Connection. Add your item for sale/wanted


Agilent 53310A-010-031

Agilent 53310A-010-031

Agilent 53310A-010-031

Model:

Agilent 53310A-010-031

Category:

Test Equipment

Model Year:

2009

Condition:

used

Value:

$ 3656.00

Location:

Florida, USA

Offered by:

Test Equipment Connection

Company Information:

Test Equipment Connection

The Worlds Largest Distributor of New, Refurbished, and Second Hand Electronic Test and Measurement (T&M) Equipment.

Lake Mary, Florida, USA

Equipment Dealer / Broker, Inspection, Manufacturer of Assembly Equipment

  • Phone 407-804-1299
  • Fax 407-804-1277

Test Equipment Connection website

Company Postings:

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Agilent 53310A-010-031 Specs:

Agilent HP 53310A-010-031. Modulation Domain Analyzer

The Agilent 53310A Modulation Domain Analyzer is an easy-to-operate, affordable modulation domain analyzer with an intuitive data display that gives you a direct view of jitter or modulation. Parameters such as peak-to-peak deviation, carrier frequency, and modulation rate are quickly and automatically displayed. Built-in analysis, including automated mean, standard deviation, and probability functions, provides detailed characterization of jitter.

In much the same way an oscilloscope provides insight into the dynamics of changing voltage, the Agilent 53310A provides insight into changes in frequency or time-interval measurements. You save time reviewing designs and locating problems. Use the Agilent 53310A to study frequency drift in electronic equipment; characterize jitter of digital communications systems, peripherals, and mechanical systems; determine frequency hopping performance of an agile transmitter, or measure cellular phone switching from cell to cell.

* Simple operation with single-button functions automated setup and measurement, large display

* Continuous frequency measurements maintain measurement relationships and prevent information loss

* Advanced triggering on frequency or time interval measurements eliminates complexity

* Fast histograms facilitate statistical characterization

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