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Press preview for Seica SpA for the Nepcon Shanghai show – Booth Hall 1, booth 4F01

Mar 31, 2011

The Compact DT system is an interesting functional test solution, equipped with analog, digital and boundary scan measurement capabilities.

The Compact DT system is an interesting functional test solution, equipped with analog, digital and boundary scan measurement capabilities.

The Pilot V8 Flying Prober  represents the latest frontier in flying probe test technology and is the complete solution for those who want maximum performance.

The Pilot V8 Flying Prober represents the latest frontier in flying probe test technology and is the complete solution for those who want maximum performance.

: Seica's innovative test and assembly solutions are being used across the globe to improve quality, increase productivity and save money in automobile, military and consumer markets. At Nepcon Shanghai we will showcase the following products and solutions:

THE COMPACT LINE reaps the benefits of the legacy and success of Seica’s preceding lines of in-circuit and functional testers, adding special attention to the needs of today’s electronic board production environments.

The Compact DT system is an interesting functional test solution, equipped with analog, digital and boundary scan measurement capabilities, all integrated in a very small enclosure characterized by high portability and readiness for rack-style assembly in more complex systems.

Pilot V8 Flying Prober

The Pilot V8 represents the latest frontier in flying probe test technology and is the complete solution for those who want maximum performance: the highest test speed, test coverage and flexibility, whether they are testing prototypes, manufacturing lots, or repairing any type of board. With 8 electrical flying probes, 2 Openfix flying probes, 2 power flying probes, 2 CCD cameras, and 2 thermal probes, the Pilot V8 has up to 16 mobile resources available to test the UUT, all included in a vertical, very compact and robust architecture, making the Pilot V8 unique in its genre. Its multiple flying probes can also execute parallel test on two UUTs at the same time, effectively doubling test capacity with respect to a 4-probe system. The mobile power probes represent another important innovation, which enables the power-up of the UUT functional test without requiring any additional, fixed cables.


Seica S.p.A, founded in 1986, is a global supplier of automatic test equipment and selective soldering systems, with an installed base of more than 800 systems on four different continents. Seica offers completely automated, laser-based selective soldering solutions, as well as a complete line of test solutions, which include bed of nails and flying probe testers; these have the ability to perform manufacturing defect analysis, in-circuit tests, functional tests and optical tests of loaded boards, second and third level electronic modules and printed circuit boards. Seica S.p.A corporate headquarters is located in Strambino, Italy, with offices in France (Paris), Germany (Munich), USA (New Hampshire and Texas), and China (Suzhou), along with a worldwide distribution network.

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