SMT, PCB Electronics Industry News

XJTAG supports Micron Phase Change Memory with JTAG test tools

Mar 02, 2011

The XJTAG boundary scan system is fast and easy to use for development or production, with features such as its high-level test-description language, graphical application helping engineers to visualise their circuits, and automated connectivity tests and DFT analysis.

The XJTAG boundary scan system is fast and easy to use for development or production, with features such as its high-level test-description language, graphical application helping engineers to visualise their circuits, and automated connectivity tests and DFT analysis.

XJTAG today announced that it is the first to provide support for Micron Omneo™ Phase Change Memory (PCM).

PCM enables enhanced system performance, and is programmed in situ after the board is assembled. XJTAG, working with Micron, has developed a solution to program PCM at close to its maximum programming speed using the XJTAG boundary scan system. It will allow customers to program PCM quickly on production lines or in development labs. This builds on XJTAG's successful XJFlash solution for high-speed programming of Flash memories.

"PCM is a compelling new memory technology that combines the best attributes found in NOR, NAND and DRAM," said Jeff Bader, senior director of marketing for Micron's embedded group. "Because PCM is a new technology, it is imperative that we build a strong ecosystem of support to further customer adoption. We are pleased with the work XJTAG has done in building a programming solution, enabling PCM to be easily deployed in a production environment."

The XJTAG boundary scan system is fast and easy to use for development or production, with features such as its high-level test-description language, graphical application helping engineers to visualise their circuits, and automated connectivity tests and DFT analysis. XJTAG's innovative software calculates how to utilise the boundary scan chain to maximise test coverage and accelerate programming of devices such as memories and PLDs.

"In addition to being the first to support this important new memory technology, we have also achieved the shortest possible in-system programming time," commented Simon Payne, CEO, XJTAG. "This is great news for product developers as they need convenient and effective methods for in situ programming and reprogramming of memories at very high speeds."

Used in conjunction with the XJTAG boundary scan debug, test and programming system, XJFlash can be used to program and verify PCM devices provided there is an FPGA or CPU on the target board and this is connected up to the JTAG chain correctly.

"With this enhancement to the XJTAG system, we can now provide high speed programming for Micron PCM devices," added Simon Payne. "This means that engineers designing complex boards containing BGA, FPGA and flash devices can do away with a separate flash programmer and utilise the full power of the XJTAG system to debug, test and program their designs throughout the product lifecycle."

A white paper explaining high speed programming of non-volatile memories is available from the XJTAG website at http://www.xjtag.com.


XJTAG (http://www.xjtag.com) is a leading global supplier of boundary scan development systems compliant with IEEE 1149 standards. XJTAG allows hardware development and manufacturing processes to be shortened significantly, through early development of re-useable tests. XJTAG development systems enable rapid hardware debug and test of both JTAG and non-JTAG (cluster) devices, such as SDRAMs, Ethernet controllers, video interfaces, Flash memories, FPGAs and microprocessors. XJTAG also enables In-System Programming of FPGAs, CPLDs and Flash memories.

Aug 17, 2023 -

XJTAG Shows the Benefits of Boundary Scan at FPGAworld

Mar 28, 2023 -

XJTAG Makes Boundary Scan Project Creation Easier & Faster

Mar 22, 2022 -

XJTAG 3.12 Boosts Focus, Flexibility and Convenience

Oct 19, 2021 -

XJTAG Ultra-Fast Flash Programmer

Jun 16, 2021 -

XJTAG Introduces Arm® SWD Support and User-Defined Libraries

Feb 19, 2020 -

XJTAG Boundary Scan 3.10 Delivers Great Ease-of-Use

Nov 11, 2019 -

XJTAG Million Dollar Product Giveaway

Jul 16, 2019 -

XJTAG Extends the Power of Boundary Scan Testing

Nov 20, 2018 -

XJTAG wins Innovator of the Year award from DESIGN&ELEKTRONIK

May 10, 2018 -

Free XJTAG DFT Assistant Offering for Mentor Xpedition Customers

9 more news from XJTAG »

Apr 18, 2024 -

ViTrox Technologies Elevates Service & Support Across US & Canada with Jeremy Woodworth's Appointment!

Apr 16, 2024 -

I.C.T | Your One-Stop Service for Smart Meter SMT Factory

Apr 15, 2024 -

Three Industry Leaders Receive IPC President's Award

Apr 15, 2024 -

IFTEC's Pierre-Jean Albrieux Inducted into the IPC Raymond E. Pritchard Hall of Fame at IPC APEX EXPO 2024

Apr 15, 2024 -

IPC Honors Summit Interconnect and Robert Bosch GmbH with Corporate Recognition Awards

Apr 15, 2024 -

IPC Publishes Comprehensive Strategy to Address Electronics Industry's Global Workforce Challenge, Calls on Leaders in Government, Business and Education for Support

Apr 15, 2024 -

Data I/O Announces Major Milestone with 500th PSV System Sale Ahead of IPC APEX Expo

Apr 15, 2024 -

IPC Announces New Board Members at IPC APEX EXPO 2024

Apr 15, 2024 -

Seika Machinery Recognizes Outstanding Sales Achievements at 2024 IPC APEX EXPO

Apr 15, 2024 -

IPC Releases "J" Revisions to Two Leading Standards for Electronics Assembly

See electronics manufacturing industry news »

XJTAG supports Micron Phase Change Memory with JTAG test tools news release has been viewed 744 times

Sell Your Used SMT & Test Equipment

See Your 2024 IPC Certification Training Schedule for Eptac