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Registration Opens for 2011 Teradyne Users Group Conference

Feb 07, 2011

The Teradyne Users Group (TUG) Conference was first incorporated by Teradyne customers in 1983. Each year the Users Group Conference is held at rotating locations within the U.S. This conference consists of technical papers, panel and poster sessions, as well as tutorials that present the latest in test technology.

The Teradyne Users Group (TUG) Conference was first incorporated by Teradyne customers in 1983. Each year the Users Group Conference is held at rotating locations within the U.S. This conference consists of technical papers, panel and poster sessions, as well as tutorials that present the latest in test technology.

Teradyne, Inc. announced that registration is now open for the 2011 Teradyne Users Group (TUG) conference at the Hard Rock Hotel in San Diego, CA on May 2-4. Reza Zoughi, Ph.D. will present this year's keynote address: "Advances in Microwave and Millimeter Wave Imaging and System Development for Nondestructive Testing & Evaluation (NDT&E)."

"The steering committee is excited to bring you a superior technical program, in an exciting hotel, in a great city"

Dr. Zoughi joined the Department of Electrical and Computer Engineering at Missouri University of Science and Technology as the Schlumberger Distinguished Professor in 2001. His current areas of research include developing new nondestructive techniques for microwave and millimeter wave testing and evaluation of materials (NDT&E), developing new electromagnetic probes and sensors to measure characteristic properties of material at microwave frequencies, developing embedded modulated scattering techniques for NDT&E purposes, and real-time high-resolution imaging system development. Dr. Zoughi currently has ten issued patents to his credit, with two more patent applications pending.

"The steering committee is excited to bring you a superior technical program, in an exciting hotel, in a great city," said Tom Munns, Semiconductor Test consultant at Texas A&M and TUG 2010 chairperson. “The longest running users group in the ATE industry once again brings you a wide array of technical papers, poster sessions and tutorials at its 2011 conference. From concurrent test on UltraFLEX™ to details of new broadband RF protocols, sessions will keep you up to date on test issues you face on a daily basis. We hope to see you in San Diego."

The TUG 2011 program is now available at the TUG website. The 2011 Semiconductor program will run for three full days and the Defense & Aerospace program will run for two. Customers can also review the technical program, view the vendors participating in the vendor fair, and register for the conference on the website. Special TUG rates at the Hard Rock Hotel and special TUG pre-registration discounts are available until March 30.

To learn more about TUG and to register for this year's exciting conference, visit the TUG website at http://www.teradyne.com/tug.

Teradyne (NYSE: TER) is the leading supplier of Automatic Test Equipment used to test complex electronics used in the consumer electronics, automotive, computing, telecommunications, and aerospace and defense industries. In 2010, Teradyne had sales of $1.6 billion. For more information, visit http://www.teradyne.com. Teradyne(R) is a registered trademark of Teradyne, Inc. in the U.S. and other countries. All product names are trademarks of Teradyne, Inc. (including its subsidiaries) or their respective owners.

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