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Kester’s Peter Biocca to Chair AOI and X-Ray Inspection Technical Session at SMTAI 2010

Oct 04, 2010

Peter Biocca, Kester's Senior Market Development Engineer.

Peter Biocca, Kester's Senior Market Development Engineer.

ITASCA, IL - Kester announces that Peter Biocca, Senior Market Development Engineer, will Co-Chair Session PRC2, titled “Strategies for Optimizing AOI and X-Ray Inspection” at the upcoming SMTA International, scheduled to take place October 24 - 28, 2010 at the Walt Disney World Swan and Dolphin Resort in Orlando, FL. The session will take place Wednesday, October 27, 2010 from 10:30 a.m.-12 p.m. in room Europe 1.

With increasing PCBA density and package complexity, reliance on AOI and X-Ray inspection to enable PCBA quality continues to grow. Strategies for optimal AOI and X-Ray application are necessary to ensure that defects are detected at the most opportunistic time with the smallest cost impact and defect escape risk.

During this session, real world users outline strategies and studies that show how to minimize defect escapes while balancing efficient utilization of inspection equipment.

For more information about Kester’s full line of products and services, contact Kester by phone at (+1) 630-616-4000 or 800-2-KESTER (53-7837), or by e-mail at customerservice@kester.com. Kester’s Web site may be found at http://www.kester.com

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