Gemini™ contactors are designed to overcome QFN contacting challenges. The single-edge DUT (device under test) tip style and the dual-spring probe architecture provide the required DUT lead pressure to break through the oxide build-up often found on lead-free devices. The probes’ extremely hard base minimizes wear and extends the lifetime of the contactor. Additionally, the parallel current paths maximize current carrying capacity, reduce contact resistance and provide a very low inductance environment.
The Multitest Gemini™ contactor design compliments the probe with slotted holes and optimized probe placement. Slotted holes precisely align the probe tips with the DUT leads of QFN devices down to 0.4mm pitch. Probes are arranged in optimized locations, ensuring the lowest inductance and the best impedance matched environment. Gemini™ contactors are leading high-performance solutions for high-volume semiconductor testing for receivers, transmitters, 4G devices, Wimax, USB 3.0 and other RF devices.
For more information about Multitest’s Gemini™, visit http://www.multitest.com/gemini.
Multitest (headquartered in Rosenheim, Germany) is one of the world’s leading manufacturers of test equipment for semiconductors. Multitest markets test handlers, contactors, and ATE printed circuit boards. Globally, more than 700 employees serve the company’s customers in offices and branches in North America, Singapore, Malaysia, the Philippines, Taiwan, China and Thailand.