“Despite the challenges the global economy has presented us all, this year’s group proved we can still connect with peers and grow our knowledge of the industry.”
“We are very happy with the success of this year’s TUG Conference,” said Johnny Steck, product and test engineering manager, Texas Instruments and TUG Chairman. “Despite the challenges the global economy has presented us all, this year’s group proved we can still connect with peers and grow our knowledge of the industry.”
Dr. Quinn C. Horn, senior managing engineer in Mechanical Engineering and Materials Science at Exponent, Inc., began the conference with his keynote address “Powering the Mobile World: When Batteries Go Bad.”
The TUG Steering Committee is also pleased to announce the winners of the TUG Conference Best Papers. The winners listed below were selected by peer evaluation on overall presentation and content.
Defense and Aerospace Track:
Winner: "The Test, Usage and Maintenance of a Power Switching Subsystem" presented by Kevin Paton, Teradyne.
Digital Session Track:
Winner: "How to Characterize Random, Data-Dependent, and Periodic Jitter and Rise Time, Fall Time and Other Parametrics Using the GigaDig for Digital Outputs Up to 12.8Gbps" presented by Tim Lyons, Carl Peach and Shawn Sullivan, Teradyne.
Mixed Signal Session Track:
Winner: "Mixed Signal Concurrent Test" presented by Antonino Grasso, Teradyne.
Power Management/Automotive Session Track:
Winner: "How to Measure Fast Rise/Fall Times on an Eagle Tester: Comparator to Convert to Prop Delay” presented by Ken Moushegian and Andrew Alleman, Texas Instruments; and Doug Pounds, Teradyne.
RF Wireless Session Track:
Winner: "Seminar: 4G Standards and Their Test Challenges" presented by Ronald Burke, Teradyne.
Test Infrastructure and Production Session Track:
Winner: "IG-XL Runtime Toolkit - A New Tool from Teradyne's Test Assistance Group” presented by Alain Tonnel, ST Ericsson; and Antonino Grasso, Teradyne.
The TUG 2010 papers and presentations are now available for Teradyne users via eKnowledge. To learn more about TUG 2010 or to get involved in TUG 2011, please visit the TUG website at http://www.teradyne.com/tug.
The Teradyne Users Group (TUG) was started in 1983 by Teradyne customers. The event is open to all licensed users of Teradyne's test systems and software products and is held each year at rotating locations within the US. The conference consists of technical papers, poster sessions and tutorials that present the latest in test technology. TUG is managed by an annually elected steering committee of Teradyne users and Teradyne appointed delegates.
Celebrating its 50th anniversary in 2010, Teradyne (NYSE:TER) is a leading supplier of Automatic Test Equipment used to test complex electronics used in the consumer electronics, automotive, computing, telecommunications, and aerospace and defense industries. In 2009, Teradyne had sales of $819 million and currently employs more than 2,900 people worldwide. For more information, visit http://www.teradyne.com. Teradyne (R) is a registered trademark of Teradyne, Inc. in the US and other countries. All product names are trademarks of Teradyne, Inc. (including its subsidiaries).