SMT, PCB Electronics Industry News

Agilent gets serious about JTAG test

Jun 29, 2010

Agilent Technologies’ interest in boundary scan test support grows with its second JTAG test systems move in a month.

Just weeks after Agilent introduced its first JTAG protocol decode and triggering application for its Infiniium oscilloscopes, it has teamed with Goepel electronic to offer a boundary scan support on its in-circuit test system.

This interest in the production test environment largely developed by specialist suppliers, such as JTAG Technologies, Goepel and UK-based XJTAG, comes from its increased popularity due to falling costs.

The JTAG/boundary-scan test and programming tools have traditionally been seen as costly and complex to implement. As a result, much of their use to date has been limited to the testing or programming of boards on the production line.

This is an outdated view and is at odds with what test system suppliers are offering in the JTAG/boundary scan market.

The cost of implementing boundary scan is falling.

So Agilent is offering the JTAG plug-on module for its utility card option on the i3070 Series 5 in-circuit tester.

The UCM3070 module can be fitted on the card, which communicates with the host system via USB.

The Agilent-validated plug-on card supports boundary scan test with two test access ports (TAPs 1.8V to 4.5V), eight parallel interface ports (PIPs) for faster flash programming and optional analogue channels.

The self test of the device rounds off the hardware package.

It supports a test clock of up to 16MHz.

JTAG, an industry standard also known as IEEE 1149.1, is commonly used in the testing of many PCBs and ICs particularly in manufacturing tests.

It is also now being used in the design environment as the complexity and pin-out of ICs increases.

In using boundary can test techniques, engineers typically take physical-level measurements and manually decode the JTAG signals, which can add time to the test process.

According to Agilent, its JTAG application for the Infiniium scopes, called N8817A, will enable the scope to perform decode in real time.

Jan 08, 2014 -

Agilent Technologies Reveals Name of Electronic Measurement Spin-Off Company

Jun 20, 2009 -

Agilent Technologies' Digital Measurement Forum Focuses on Trends Influencing Future of Industry

Feb 15, 2009 -

Agilent Technologies Presents the 2009 Aerospace Defense Symposium "Focus Where it Counts"

Jan 21, 2009 -

Agilent Technologies' New Solder Paste Inspection System Available Feb. 15

Dec 06, 2008 -

Agilent Technologies Displays Comprehensive Femtocell Testing Capability

Nov 19, 2008 -

Agilent Technologies, Solution Sources Programming Announce Additional In-Circuit Test Capacity at Solution Sources

Oct 01, 2008 -

Agilent Technologies to Present Advances in Limited Access Test Solutions at International Test Week

Sep 24, 2008 -

Agilent Technologies, Altron Inc. Announce Altron's Selection of Agilent Medalist sj5000 AOI System

Sep 08, 2008 -

Agilent Technologies' New 10 MHz Function/Arbitrary Waveform Generator Provides High-Quality Waveforms at Economical Price

Sep 08, 2008 -

Agilent Technologies Introduces Customizable, Easy-to-Use Display Test Solutions for IT, Consumer Electronics Manufacturing

85 more news from Agilent Technologies, Inc. »

Aug 16, 2017 -

SMTA Capital Expo to Feature Essemtec Fox Pick and Place System

Aug 16, 2017 -

All-in-One Low-cost, Scalable Functional test, In-System Programming, Boundary Scan / JTAG, In-Circuit Test System from Acculogic Visit Booth #133 at SMTA International

Aug 16, 2017 -

PDR’s New IR Thermal Test System Thermally Cycles Key Critical Components to Detect Defects

Aug 16, 2017 -

Automated X-ray Inspection with Component Counting from Scienscope at SMTAI

Aug 15, 2017 -

Nordson Brings Its Flagship Inspection Systems to SMTAI

Aug 15, 2017 -

Pickering Interfaces to Introduce New PXI and LXI Switching Solutions at IEEE AUTOTESTCON

Aug 15, 2017 -

Entry-Level Selective Soldering System with High-End Technology from SEHO at productronica India

Aug 15, 2017 -

KYZEN to Show Real-Time Data Analyst for All Cleaning Processes at SMTAI

Aug 15, 2017 -

Nihon Superior Solves Industry Challenges with New Solder Pastes – Visit Booth #532 at SMTAI

Aug 15, 2017 -

CyberOptics to Demonstrate 3D AOI with Ultra-High Resolution MRS Sensor at SMTA International

See electronics manufacturing industry news »

Agilent gets serious about JTAG test news release has been viewed 1239 times

SMT Prototype Stencils - BEST, Inc.