Mar 04, 2009
Prof. Pecht is working with the PHM team at Beihang University under the direction of Prof. Rui Kang. At Beihang there are more than 30 researchers engaged in failure PHM for electronic, mechanical, and opto-electrical products. They have an excellent suite of reliability test and failure analysis equipment and are significantly supported by the Chinese government. Prof. Pecht is also cooperating with Yokohama National University (YNU) in Japan. Prof. Qiang Yu leads the electronic packaging group at YNU, and his group has excellent reliability analysis facilities and simulation approaches for electronics. Prof. Yu also has excellent working relationships with Japanese companies and CALCE. Dr. Shibutani of YNU will be a key person leading the PHM effort with Prof. Yu. They also play important roles at the JSME Research Consortium of High Density Microelectronics Reliability.
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