SMT, PCB Electronics Industry News

SMT, PCB Electronics Industry News

News from Agilent Technologies, Inc.


Agilent Technologies to Present Advances in Limited Access Test Solutions at International Test Week

Oct 01, 2008

What: Topics include:

Engineering Test Coverage on Complex Sockets (Paper 11.1)

Augmenting Boundary-Scan Tests for Enhanced Defect Coverage (Paper 11.3)

Finding Power/Ground Defects on Connectors �V Case Study (Paper 15.2)

Boundary-Scan Testing of Power/Ground Pins (Paper 29.1)

When: October 28- 30, 2008

Where: Santa Clara, Calif., International Test Conference, Santa Clara Convention Center Halls A, B & C

Additional Information: www.itctestweek.org

www.agilent.com/see/vtep

# # #

NOTE TO EDITORS: Further technology, corporate citizenship and executive news is available on the Agilent news site at http://www.agilent.com/go/news.

MEDIA/ANALYSTS: For any additional questions about Agilent Technologies or to schedule a briefing, contact Janet Smith at +1 970 679 5397 or janet_smith@agilent.com.

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