The Agilent N9201A, which significantly reduces the time engineers need to optimize process parameters and maximize yields, has been very well accepted by customers ramping up advanced semiconductor technologies. Introduced in October 2006, the Agilent N9201A speeds up the yield ramp-up phase significantly by allowing engineers to test more structures in less time and with greater throughput. It provides fast parallel measurement of array test structures (both passive and addressable), reducing the time engineers need to optimize process parameters and maximize yields.
"We are very honored to receive this prestigious award," said Minoru Ebihara, vice president and general manager of Agilent's Hachioji Semiconductor Test Division. "This award is especially meaningful to us because we were acknowledged by both our customers and peers in the industry as offering a product that provides superior capabilities that were not previously available in semiconductor manufacturing."
More information about the award is available at http://www.semiconductor.net/awards.
Additional information about the Agilent N9201A Array Structure Parametric Test Solution can be found at http://www.agilent.com/find/N9201A. A high-resolution image of Agilent's N9201A Array Structure Parametric Test Solution is available at http://www.agilent.com/find/N9201A_image.
About Agilent Technologies
Agilent Technologies Inc. (NYSE: A) is the world's premier measurement company and a technology leader in communications, electronics, life sciences and chemical analysis. The company's 19,000 employees serve customers in more than 110 countries. Agilent had net revenue of $5.4 billion in fiscal 2007. Information about Agilent is available on the Web at http://www.agilent.com.