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Aqueous Technologies to Display Zero-Ion Contamination Tester at APEX 2008

Mar 20, 2008

Rancho Cucamonga, CA - March 2008 � Aqueous Technologies Corp. announces that it will feature the Zero-Ion Ionic Contamination (Cleanliness) Tester, which is designed to test electronics assemblies for ionic contamination, in booth 2431 at the upcoming APEX 2008 exhibition and conference scheduled to take place April 1-3, 2008 in Las Vegas.

The Zero-Ion automatically removes and detects contamination on an electrical assembly or bare board and provides quantitative contamination measurements.

The Zero-Ion uses a dynamic technology that provides automatic regeneration of the machine�s test solution, maintaining a high degree of test solution sensitivity. The Zero-Ion meets the requirements of military and commercial cleanliness testing standards including MIL 2000A, IPC test method 001, MIL-C-28809, MIL-P-55110 and IPC TM650-2.3.26.

The Zero-Ion has been reviewed by the U.S. Naval Air Weapons Center and determined to be the most sensitive ionic contamination tester available. The Zero-Ion also has been determined to be 3.7 times more sensitive than the manual resistivity of solvent extract (R.O.S.E.) test.

The Zero-Ion performs cleanliness tests automatically and is capable of storing 50 test parameters within its internal controller. When connected to a PC via optional PC interface software, the Zero-Ion is capable of storing virtually unlimited quantities of testing parameters.

The Zero-Ion is equipped with a built-in printer that records cleanliness testing results.

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