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Aqueous Technologies to Feature C3 Cleanliness Tester at APEX 2008

Mar 12, 2008

Rancho Cucamonga, CA - March 2008 � Aqueous Technologies Corp. announces that it will exhibit the C3 Cleanliness Tester in booth 2431 at the upcoming APEX 2008 exhibition and conference scheduled to take place April 1-3, 2008 in Las Vegas.

The C3 � Critical Cleanliness Control � ionic cleanliness tester was developed by Forsite, a leading analytical test laboratory specializing in residue characterization for the electronics industry. Aqueous Technologies, a leading manufacturer of automated defluxing systems and cleanliness testing equipment for the electronics industry has been appointed as the exclusive worldwide distributor of C3.

C3 is unique from other contamination testers on the market. It is the first tester to examine contamination in a localized area of a PCB assembly. By looking at a localized area of 0.1 in2, the C3 ionic cleanliness tester provides immediate feedback as to whether or not the area is ionically �clean� or �dirty.� The localized testing format of the C3 allows users to look at specific components or areas of circuitry that are particularly sensitive and prone to performance issues.

By using the C3 Tester, the presence of conductive or corrosive residues can be detected quickly and effectively. The system is designed for efficiency and provides the immediate process monitoring data that an off-site testing facility cannot. With a user-friendly touch-screen, the C3 pinpoints the problem areas that need further analysis. When further analysis is needed, users can send off the sample collected by the C3 for further testing to determine exactly what contaminants are present.

C3 is the only cleanliness testing method capable of determining where a contaminant is, the level of contamination and what the contamination is. C3 collects and stores samples of the extracted contaminant. The stored sample may be sent to the Forsite laboratory for identification via Ion Chromatography (for an added fee).

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