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Agilent Technologies Announces Webcasts on Semiconductor Test

Oct 10, 2007

What: Engineers and scientists face many difficulties when characterizing advanced semiconductor processes. In these webcasts information will be provide on how to solve measurement challenges, how to optimize cost versus performance and also be introduced to EasyExpert software used for CV to HFCV measurements.

Where: Semiconductor Capacitance Measurement Solutions.

When: October 17, 10:00am-11:00am (PT-US)

http://www.get.agilent.com/vmx_link.cgi?site=para&code=4206pr&ref=4206_eSem_CV_Oct17_PR_Reg_E

Solve Advanced Parametric Challenges: Using your Semiconductor Device Analyzer Effectively

October 24, 10:00am-11:00am (PT-US)

http://www.get.agilent.com/vmx_link.cgi?site=para&code=4162pr&ref=4162_eSem_Parametric_Oct07_PR_Reg_E

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