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Cyber Technologies Intros New Features at IMAPS 2006

Aug 24, 2006

MINNEAPOLIS, MN- Cyber Technologies, the worldwide leader in high-resolution, 3D laser-based metrology for microelectronics manufacturing, is introducing several new features to its family of CyberScan Vantage Measurement Systems at IMAPS 2006, October 8-12, in San Diego, CA � Booth 201.

For IMAPS, the company will release Scan CT Suite 7.1, the latest version of its 2D and 3D profiling software. Version 7.1 includes a number of new measurement and data handling capabilities. Operating on Windows XP Professional, Scan CT Suite 7.1 includes roughness algorithms developed to ISO EN 13565 and EN 11562 standards. Other new features include Automatic Edge Detection, user-created Macros, and more flexible results recording techniques. In addition, multiple scans can be combined in one worksheet for comparing/contrasting data. The new capabilities of Scan CT 7.1 can also be found in Version 3.1 of the company�s AScan Automated Application Software, to be released simultaneously with the new Scan CT Suite.

Hardware on the CyberScan Vantage has also been improved to eliminate mechanical noise and vibration, providing a machine accuracy down to 20 nanometers (0.02�m/ 0.0000008�).

Cyber Technologies� CyberScan Vantage Systems can accept a number sensor types and models, with resolutions to 0.01�m (0.0000004�) and ranges up to 8 mm (0.315�).

For more information, contact:

Michael Riddle

Cyber Technologies USA

4200 Powderhorn Circle

Minnetonka, MN 55345-1615 USA

Ph: +1- 952-401-9700

Fax: +1-952-474-2211

Email: michael.riddle@cybertechnologies.com

Web site: http://www.cybertechnologies.com

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